{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T08:15:44Z","timestamp":1725783344038},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,5,19]],"date-time":"2024-05-19T00:00:00Z","timestamp":1716076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,19]],"date-time":"2024-05-19T00:00:00Z","timestamp":1716076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,5,19]]},"DOI":"10.1109\/iscas58744.2024.10558625","type":"proceedings-article","created":{"date-parts":[[2024,7,2]],"date-time":"2024-07-02T17:22:52Z","timestamp":1719940972000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["A Closed-Loop Readout Circuit with Voltage Drop Mitigation for Emerging Resistive Technologies"],"prefix":"10.1109","author":[{"given":"Andrea","family":"Mifsud","sequence":"first","affiliation":[{"name":"Imperial College London,Department of Electrical and Electronic Engineering,UK,SW7 2BT"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Adil","family":"Malik","sequence":"additional","affiliation":[{"name":"Imperial College London,Department of Electrical and Electronic Engineering,UK,SW7 2BT"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Abdulaziz","family":"Alshaya","sequence":"additional","affiliation":[{"name":"Imperial College London,Department of Electrical and Electronic Engineering,UK,SW7 2BT"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Peilong","family":"Feng","sequence":"additional","affiliation":[{"name":"Imperial College London,Department of Electrical and Electronic Engineering,UK,SW7 2BT"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Timothy G.","family":"Constandinou","sequence":"additional","affiliation":[{"name":"Imperial College London,Department of Electrical and Electronic Engineering,UK,SW7 2BT"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2297417"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3025756"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2023.3314433"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3117260"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2009.2038610"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2020.2983100"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS48785.2022.9937343"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ESSDERC.2017.8066595"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS51556.2021.9401123"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.35848\/1347-4065\/ab6d86"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICMTS.2019.8730955"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2018.2791468"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2016.2545412"},{"journal-title":"Unimore resistive random access memory (RRAM) verilog-a model","author":"Puglisi","key":"ref14"}],"event":{"name":"2024 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2024,5,19]]},"location":"Singapore, Singapore","end":{"date-parts":[[2024,5,22]]}},"container-title":["2024 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10557746\/10557828\/10558625.pdf?arnumber=10558625","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,7,3]],"date-time":"2024-07-03T07:03:53Z","timestamp":1719990233000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10558625\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5,19]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/iscas58744.2024.10558625","relation":{},"subject":[],"published":{"date-parts":[[2024,5,19]]}}}