{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T06:50:34Z","timestamp":1781851834782,"version":"3.54.5"},"reference-count":8,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,5,24]],"date-time":"2026-05-24T00:00:00Z","timestamp":1779580800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,5,24]],"date-time":"2026-05-24T00:00:00Z","timestamp":1779580800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,5,24]]},"DOI":"10.1109\/iscas66217.2026.11562011","type":"proceedings-article","created":{"date-parts":[[2026,6,18]],"date-time":"2026-06-18T20:06:41Z","timestamp":1781813201000},"page":"4272-4276","source":"Crossref","is-referenced-by-count":0,"title":["A 14-bit 4GS\/s DAC Achieving 68dBc SFDR Up to 1.7GHz with Digital Pre-Distortion and Switching-Glitch Compensation in 28nm CMOS Process"],"prefix":"10.1109","author":[{"given":"Junfeng","family":"Wang","sequence":"first","affiliation":[{"name":"University of Electronic Science and Technology of China,The State Key Laboratory of Electronic Thin Films and Integrated Devices,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Kejun","family":"Wu","sequence":"additional","affiliation":[{"name":"University of Electronic Science and Technology of China,The State Key Laboratory of Electronic Thin Films and Integrated Devices,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jun","family":"Liu","sequence":"additional","affiliation":[{"name":"University of Electronic Science and Technology of China,The State Key Laboratory of Electronic Thin Films and Integrated Devices,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Shiteng","family":"Li","sequence":"additional","affiliation":[{"name":"University of Electronic Science and Technology of China,The State Key Laboratory of Electronic Thin Films and Integrated Devices,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Qianfeng","family":"Zhang","sequence":"additional","affiliation":[{"name":"University of Electronic Science and Technology of China,The State Key Laboratory of Electronic Thin Films and Integrated Devices,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Geyou","family":"Hu","sequence":"additional","affiliation":[{"name":"University of Electronic Science and Technology of China,The State Key Laboratory of Electronic Thin Films and Integrated Devices,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xin","family":"Duan","sequence":"additional","affiliation":[{"name":"University of Electronic Science and Technology of China,The State Key Laboratory of Electronic Thin Films and Integrated Devices,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zhen","family":"Yu","sequence":"additional","affiliation":[{"name":"University of Electronic Science and Technology of China,The State Key Laboratory of Electronic Thin Films and Integrated Devices,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ning","family":"Ning","sequence":"additional","affiliation":[{"name":"University of Electronic Science and Technology of China,The State Key Laboratory of Electronic Thin Films and Integrated Devices,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jing","family":"Li","sequence":"additional","affiliation":[{"name":"University of Electronic Science and Technology of China,The State Key Laboratory of Electronic Thin Films and Integrated Devices,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zhong","family":"Zhang","sequence":"additional","affiliation":[{"name":"University of Electronic Science and Technology of China,The State Key Laboratory of Electronic Thin Films and Integrated Devices,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Qi","family":"Yu","sequence":"additional","affiliation":[{"name":"University of Electronic Science and Technology of China,The State Key Laboratory of Electronic Thin Films and Integrated Devices,China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2168651"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2024.3427767"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2022.3198233"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2018.2866819"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2032624"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3079111"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2023.3242658"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2021.3123251"}],"event":{"name":"2026 IEEE International Symposium on Circuits and Systems (ISCAS)","location":"Shanghai, China","start":{"date-parts":[[2026,5,24]]},"end":{"date-parts":[[2026,5,28]]}},"container-title":["2026 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11561899\/11561804\/11562011.pdf?arnumber=11562011","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T05:51:09Z","timestamp":1781848269000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11562011\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,5,24]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/iscas66217.2026.11562011","relation":{},"subject":[],"published":{"date-parts":[[2026,5,24]]}}}