{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T05:54:56Z","timestamp":1781848496815,"version":"3.54.5"},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,5,24]],"date-time":"2026-05-24T00:00:00Z","timestamp":1779580800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,5,24]],"date-time":"2026-05-24T00:00:00Z","timestamp":1779580800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,5,24]]},"DOI":"10.1109\/iscas66217.2026.11562092","type":"proceedings-article","created":{"date-parts":[[2026,6,18]],"date-time":"2026-06-18T20:06:41Z","timestamp":1781813201000},"page":"2708-2712","source":"Crossref","is-referenced-by-count":0,"title":["S\n                    <sup>2<\/sup>\n                    PUF: A &lt;1.77E\u22128 BER Schmitt Effect SRAM PUF with Load Tilt Masking for Resource-Constrained systems"],"prefix":"10.1109","author":[{"given":"Xijun","family":"Huang","sequence":"first","affiliation":[{"name":"Hunan University,College of Electrical and Information Engineering,Changsha,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Li","family":"Ni","sequence":"additional","affiliation":[{"name":"Hunan University,College of Semiconductors (College of Integrated Circuits),Changsha,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jinwei","family":"Pu","sequence":"additional","affiliation":[{"name":"Hunan University,College of Semiconductors (College of Integrated Circuits),Changsha,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"You","family":"Meng","sequence":"additional","affiliation":[{"name":"Hunan University,College of Semiconductors (College of Integrated Circuits),Changsha,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Kai","family":"Tang","sequence":"additional","affiliation":[{"name":"Hunan University,College of Electrical and Information Engineering,Changsha,China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MCAS.2017.2713305"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2017.69"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2023.3339296"},{"key":"ref4","first-page":"9","article-title":"Physical Unclonable Functions for Device Authentication and Secret Key Generation","volume-title":"2007 44th ACM\/IEEE Design Automation Conference (DAC)","author":"Suh"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2942374"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2636859"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2506641"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2938133"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2963002"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870303"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.2996772"},{"key":"ref12","first-page":"1","article-title":"S2RAM PUF: An Ultra-low Power Subthreshold SRAM PUF with Zero Bit Error Rate","volume-title":"2024 61st ACM\/IEEE Design Automation Conference (DAC)","author":"Ni"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3035207"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2025.3608858"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.23919\/VLSITechnologyandCir57934.2023.10185261"}],"event":{"name":"2026 IEEE International Symposium on Circuits and Systems (ISCAS)","location":"Shanghai, China","start":{"date-parts":[[2026,5,24]]},"end":{"date-parts":[[2026,5,28]]}},"container-title":["2026 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11561899\/11561804\/11562092.pdf?arnumber=11562092","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T05:47:58Z","timestamp":1781848078000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11562092\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,5,24]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/iscas66217.2026.11562092","relation":{},"subject":[],"published":{"date-parts":[[2026,5,24]]}}}