{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T05:53:48Z","timestamp":1781848428542,"version":"3.54.5"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,5,24]],"date-time":"2026-05-24T00:00:00Z","timestamp":1779580800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,5,24]],"date-time":"2026-05-24T00:00:00Z","timestamp":1779580800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,5,24]]},"DOI":"10.1109\/iscas66217.2026.11562234","type":"proceedings-article","created":{"date-parts":[[2026,6,18]],"date-time":"2026-06-18T20:06:41Z","timestamp":1781813201000},"page":"1368-1372","source":"Crossref","is-referenced-by-count":0,"title":["Residual Convolutional Neural Networks for Digital Calibration of Oversampled ADCs"],"prefix":"10.1109","author":[{"given":"Shamma","family":"Nasrin","sequence":"first","affiliation":[{"name":"Arizona State University,School of Electrical, Computer and Energy Engineering,AZ,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Matt","family":"Kinsinger","sequence":"additional","affiliation":[{"name":"Arizona State University,School of Electrical, Computer and Energy Engineering,AZ,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Anoop","family":"Bengaluru","sequence":"additional","affiliation":[{"name":"Arizona State University,School of Electrical, Computer and Energy Engineering,AZ,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jia-Ching","family":"Chuang","sequence":"additional","affiliation":[{"name":"Arizona State University,School of Electrical, Computer and Energy Engineering,AZ,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Sumukh","family":"Bhanushali","sequence":"additional","affiliation":[{"name":"Arizona State University,School of Electrical, Computer and Energy Engineering,AZ,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Arindam","family":"Sanyal","sequence":"additional","affiliation":[{"name":"Arizona State University,School of Electrical, Computer and Energy Engineering,AZ,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2022.3166792"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/esscirc.2016.7598327"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.23919\/VLSICircuits52068.2021.9492344"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/vlsic.2016.7573465"},{"key":"ref5","first-page":"197","article-title":"8.6fJ\/step VCO-Based CT 2 nd -Order $\\Delta\\Sigma$ ADC","author":"Jayaraj","year":"2019"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/APCCAS62602.2024.10808889"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICTA64028.2024.10860317"},{"key":"ref8","first-page":"285","article-title":"A 13.2fJ\/step 74.3-dB SNDR Pipelined Noise-shaping SAR+VCO ADC","volume-title":"ESSCIRC 2023-IEEE 49th European Solid State Circuits Conference (ESSCIRC).","author":"Bhanushali"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2019.2946215"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC55480.2022.9911287"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2019.8902873"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS58744.2024.10558198"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC61188.2025.11082833"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2022.3201016"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2024.3390220"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2941956"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3020194"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2014.6942061"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/EDTM50988.2021.9420899"}],"event":{"name":"2026 IEEE International Symposium on Circuits and Systems (ISCAS)","location":"Shanghai, China","start":{"date-parts":[[2026,5,24]]},"end":{"date-parts":[[2026,5,28]]}},"container-title":["2026 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11561899\/11561804\/11562234.pdf?arnumber=11562234","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T05:39:12Z","timestamp":1781847552000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11562234\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,5,24]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/iscas66217.2026.11562234","relation":{},"subject":[],"published":{"date-parts":[[2026,5,24]]}}}