{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T05:53:32Z","timestamp":1781848412197,"version":"3.54.5"},"reference-count":9,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,5,24]],"date-time":"2026-05-24T00:00:00Z","timestamp":1779580800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,5,24]],"date-time":"2026-05-24T00:00:00Z","timestamp":1779580800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,5,24]]},"DOI":"10.1109\/iscas66217.2026.11562267","type":"proceedings-article","created":{"date-parts":[[2026,6,18]],"date-time":"2026-06-18T20:06:41Z","timestamp":1781813201000},"page":"293-297","source":"Crossref","is-referenced-by-count":0,"title":["On Resistor Nonlinearity Modeling for Low-Distortion Analog Circuits"],"prefix":"10.1109","author":[{"given":"Nagendra","family":"Krishnapura","sequence":"first","affiliation":[{"name":"Indian Institute of Technology Madras,Chennai,India"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Paramita","family":"Banerjee","sequence":"additional","affiliation":[{"name":"Indian Institute of Technology Madras,Chennai,India"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Bobba","family":"Bhavani","sequence":"additional","affiliation":[{"name":"Rajiv Gandhi University of Knowledge Technologies,Nuzvid,India"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yadala","family":"Venkat","sequence":"additional","affiliation":[{"name":"Rajiv Gandhi University of Knowledge Technologies,Nuzvid,India"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/PRIME.2016.7519535"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/LSSC.2024.3412634"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2196730"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.3013691"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/16.568043"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/4.278342"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/43.863638"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1051\/matecconf\/20152202023"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/S0749-6036(03)00068-5"}],"event":{"name":"2026 IEEE International Symposium on Circuits and Systems (ISCAS)","location":"Shanghai, China","start":{"date-parts":[[2026,5,24]]},"end":{"date-parts":[[2026,5,28]]}},"container-title":["2026 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11561899\/11561804\/11562267.pdf?arnumber=11562267","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T05:35:05Z","timestamp":1781847305000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11562267\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,5,24]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/iscas66217.2026.11562267","relation":{},"subject":[],"published":{"date-parts":[[2026,5,24]]}}}