{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,6]],"date-time":"2026-07-06T20:16:20Z","timestamp":1783368980768,"version":"3.54.6"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,5,24]],"date-time":"2026-05-24T00:00:00Z","timestamp":1779580800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,5,24]],"date-time":"2026-05-24T00:00:00Z","timestamp":1779580800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,5,24]]},"DOI":"10.1109\/iscas66217.2026.11562421","type":"proceedings-article","created":{"date-parts":[[2026,6,18]],"date-time":"2026-06-18T20:06:41Z","timestamp":1781813201000},"page":"3087-3091","source":"Crossref","is-referenced-by-count":0,"title":["A ML-based Robust Channel Estimation Enhancer Against Multi-Tone Jamming in OFDM systems"],"prefix":"10.1109","author":[{"given":"Chaofan","family":"Deng","sequence":"first","affiliation":[{"name":"Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,GA,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ashwin","family":"Bhat","sequence":"additional","affiliation":[{"name":"Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,GA,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Adou Sangbone","family":"Assoa","sequence":"additional","affiliation":[{"name":"Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,GA,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Katarina","family":"Vuckovic","sequence":"additional","affiliation":[{"name":"Collins Aerospace,Advanced Research and Technology,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Subhashish","family":"Chakravarty","sequence":"additional","affiliation":[{"name":"Collins Aerospace,Advanced Research and Technology,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Arijit","family":"Raychowdhury","sequence":"additional","affiliation":[{"name":"Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,GA,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/COMST.2014.2349883"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/GLOCOM.2012.6503792"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCOM.1982.1095479"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MILCOM61039.2024.10773998"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VTC2021-Spring51267.2021.9448897"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCOM.1984.1095986"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/CISP.2015.7408087"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2016.2646744"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/SSP49050.2021.9513803"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/OJSP.2024.3453176"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICC45041.2023.10278618"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/VTS-APWCS.2019.8851633"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/s10291-015-0442-8"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2023.3265341"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCCN.2025.3576813"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICC51166.2024.10622864"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/MILCOM61039.2024.10773873"},{"key":"ref18","article-title":"Sionna","author":"Hoydis","year":"2022"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/SPAWC60668.2024.10694375"}],"event":{"name":"2026 IEEE International Symposium on Circuits and Systems (ISCAS)","location":"Shanghai, China","start":{"date-parts":[[2026,5,24]]},"end":{"date-parts":[[2026,5,28]]}},"container-title":["2026 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11561899\/11561804\/11562421.pdf?arnumber=11562421","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,7,6]],"date-time":"2026-07-06T19:42:27Z","timestamp":1783366947000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11562421\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,5,24]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/iscas66217.2026.11562421","relation":{},"subject":[],"published":{"date-parts":[[2026,5,24]]}}}