{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,13]],"date-time":"2026-07-13T20:10:25Z","timestamp":1783973425105,"version":"3.55.0"},"reference-count":17,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,5,24]],"date-time":"2026-05-24T00:00:00Z","timestamp":1779580800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,5,24]],"date-time":"2026-05-24T00:00:00Z","timestamp":1779580800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,5,24]]},"DOI":"10.1109\/iscas66217.2026.11562474","type":"proceedings-article","created":{"date-parts":[[2026,6,18]],"date-time":"2026-06-18T20:06:41Z","timestamp":1781813201000},"page":"1556-1560","source":"Crossref","is-referenced-by-count":0,"title":["Energy-Efficiency Monitoring and Parallel Fault Protection BMIC for Battery Management"],"prefix":"10.1109","author":[{"given":"Guangqian","family":"Zhu","sequence":"first","affiliation":[{"name":"Xidian University,Zhejiang Key Laboratory of Analog Integrated Circuits, Hangzhou Institute of Technology,Hangzhou,China,311231"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jiayi","family":"Yang","sequence":"additional","affiliation":[{"name":"Xidian University,Zhejiang Key Laboratory of Analog Integrated Circuits, Hangzhou Institute of Technology,Hangzhou,China,311231"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Wenqi","family":"Li","sequence":"additional","affiliation":[{"name":"Xidian University,Zhejiang Key Laboratory of Analog Integrated Circuits, Hangzhou Institute of Technology,Hangzhou,China,311231"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Wei","family":"Guo","sequence":"additional","affiliation":[{"name":"Xidian University,Zhejiang Key Laboratory of Analog Integrated Circuits, Hangzhou Institute of Technology,Hangzhou,China,311231"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yongyuan","family":"Li","sequence":"additional","affiliation":[{"name":"Xidian University,Zhejiang Key Laboratory of Analog Integrated Circuits, Hangzhou Institute of Technology,Hangzhou,China,311231"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yang","family":"Liu","sequence":"additional","affiliation":[{"name":"Xidian University,Zhejiang Key Laboratory of Analog Integrated Circuits, Hangzhou Institute of Technology,Hangzhou,China,311231"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zhangming","family":"Zhu","sequence":"additional","affiliation":[{"name":"Xidian University,Zhejiang Key Laboratory of Analog Integrated Circuits, Hangzhou Institute of Technology,Hangzhou,China,311231"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2025.3531822"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2025.106900"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2019.8662541"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2025.3551284"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2300861"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC49661.2025.10904765"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2953939"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICTA50426.2020.9332094"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42615.2023.10067607"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/OJCAS.2024.3391829"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2023.105782"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2014.2303989"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2024.106327"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC19947.2020.9063066"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3044165"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS56072.2025.11043530"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/A-SSCC67472.2025.11349534"}],"event":{"name":"2026 IEEE International Symposium on Circuits and Systems (ISCAS)","location":"Shanghai, China","start":{"date-parts":[[2026,5,24]]},"end":{"date-parts":[[2026,5,28]]}},"container-title":["2026 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11561899\/11561804\/11562474.pdf?arnumber=11562474","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,7,13]],"date-time":"2026-07-13T20:01:14Z","timestamp":1783972874000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11562474\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,5,24]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/iscas66217.2026.11562474","relation":{},"subject":[],"published":{"date-parts":[[2026,5,24]]}}}