{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T05:53:15Z","timestamp":1781848395917,"version":"3.54.5"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,5,24]],"date-time":"2026-05-24T00:00:00Z","timestamp":1779580800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,5,24]],"date-time":"2026-05-24T00:00:00Z","timestamp":1779580800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100007162","name":"Guangdong Science and Technology Department","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100007162","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,5,24]]},"DOI":"10.1109\/iscas66217.2026.11562615","type":"proceedings-article","created":{"date-parts":[[2026,6,18]],"date-time":"2026-06-18T20:06:41Z","timestamp":1781813201000},"page":"967-971","source":"Crossref","is-referenced-by-count":0,"title":["CIM-SIFT: An Efficient Compute-in-Memory Accelerator for Real-time SIFT Algorithm"],"prefix":"10.1109","author":[{"given":"Zhengxi","family":"Yan","sequence":"first","affiliation":[{"name":"The Hong Kong University of Science and Technology (Guangzhou),Microelectronics Thrust,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Cong","family":"Wang","sequence":"additional","affiliation":[{"name":"The Hong Kong University of Science and Technology (Guangzhou),Microelectronics Thrust,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xipeng","family":"Lin","sequence":"additional","affiliation":[{"name":"The Hong Kong University of Science and Technology (Guangzhou),Microelectronics Thrust,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jing","family":"Zhang","sequence":"additional","affiliation":[{"name":"The Hong Kong University of Science and Technology (Guangzhou),Microelectronics Thrust,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hongwu","family":"Jiang","sequence":"additional","affiliation":[{"name":"The Hong Kong University of Science and Technology (Guangzhou),Microelectronics Thrust,China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1186\/s41074-017-0027-2"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICFPT56656.2022.9974562"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1023\/b:visi.0000029664.99615.94"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICOMET.2018.8346440"},{"key":"ref5","article-title":"A comparison of sift, pca-sift and surf","volume-title":"tech. rep., Computer Graphics Lab","author":"Juan","year":"2004"},{"key":"ref6","article-title":"Image matching using sift, surf, brief and orb: Performance comparison for distorted images","volume-title":"tech. rep., Faculty of Engineering and Applied Sciences","author":"Karami"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSVT.2014.2302535"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/FPT.2009.5377651"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s11554-014-0446-6"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/NCVPRIPG.2013.6776198"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s10470-019-01419-9"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2009.2034234"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2019.2936818"},{"key":"ref14","volume-title":"Affine covariant features"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICFPT52863.2021.9609932"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2022.3199475"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3104387"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2024.3362822"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/3658617.3697630"}],"event":{"name":"2026 IEEE International Symposium on Circuits and Systems (ISCAS)","location":"Shanghai, China","start":{"date-parts":[[2026,5,24]]},"end":{"date-parts":[[2026,5,28]]}},"container-title":["2026 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11561899\/11561804\/11562615.pdf?arnumber=11562615","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T05:32:43Z","timestamp":1781847163000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11562615\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,5,24]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/iscas66217.2026.11562615","relation":{},"subject":[],"published":{"date-parts":[[2026,5,24]]}}}