{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T06:50:53Z","timestamp":1781851853775,"version":"3.54.5"},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,5,24]],"date-time":"2026-05-24T00:00:00Z","timestamp":1779580800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,5,24]],"date-time":"2026-05-24T00:00:00Z","timestamp":1779580800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,5,24]]},"DOI":"10.1109\/iscas66217.2026.11562725","type":"proceedings-article","created":{"date-parts":[[2026,6,18]],"date-time":"2026-06-18T20:06:41Z","timestamp":1781813201000},"page":"1531-1535","source":"Crossref","is-referenced-by-count":0,"title":["Jitter Reduction in Voltage Controlled Oscillators for Clocking at Cryogenic Temperature"],"prefix":"10.1109","author":[{"given":"Rakshith","family":"Saligram","sequence":"first","affiliation":[{"name":"Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Suman","family":"Datta","sequence":"additional","affiliation":[{"name":"Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Arijit","family":"Raychowdhury","sequence":"additional","affiliation":[{"name":"Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,USA"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/vlsitechnology18217.2020.9265065"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/led.2021.3117277"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/irps45951.2020.9129312"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2017.2737549"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2019.8662480"},{"key":"ref6","first-page":"134","article-title":"A low noise CMOS preamplifier operating at 4.2 Kelvin","volume-title":"Proc. 19th Eur. Solid-State CircuitsConf. (ESSCIRC)","volume":"1","author":"Kleine"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2007.905092"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/cicc51472.2021.9431559"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/iedm.2016.7838029"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/jxcdc.2021.3131100"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2020.3021999"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1063\/1.344321"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1002\/pssa.2211240225"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/mssc.2019.2939771"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2006.876206"},{"key":"ref16","year":"2022","journal-title":"Synposys PrimeSim HSPICE User Guide: Advanced Analog Simulation and Analysis"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/cicc51472.2021.9431541"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/tvlsi.2016.2541718"},{"key":"ref19","article-title":"Temperature dependence of semi-conductor conductivity","author":"Green","year":"2014"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/iedm.1988.32743"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/iscas.2019.8702452"}],"event":{"name":"2026 IEEE International Symposium on Circuits and Systems (ISCAS)","location":"Shanghai, China","start":{"date-parts":[[2026,5,24]]},"end":{"date-parts":[[2026,5,28]]}},"container-title":["2026 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11561899\/11561804\/11562725.pdf?arnumber=11562725","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T05:54:15Z","timestamp":1781848455000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11562725\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,5,24]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/iscas66217.2026.11562725","relation":{},"subject":[],"published":{"date-parts":[[2026,5,24]]}}}