{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T05:54:58Z","timestamp":1781848498364,"version":"3.54.5"},"reference-count":24,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,5,24]],"date-time":"2026-05-24T00:00:00Z","timestamp":1779580800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,5,24]],"date-time":"2026-05-24T00:00:00Z","timestamp":1779580800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,5,24]]},"DOI":"10.1109\/iscas66217.2026.11562838","type":"proceedings-article","created":{"date-parts":[[2026,6,18]],"date-time":"2026-06-18T20:06:41Z","timestamp":1781813201000},"page":"2475-2479","source":"Crossref","is-referenced-by-count":0,"title":["An Edge-Pursuit Ising Machine with Programmable Local Fields and Adaptive Annealing"],"prefix":"10.1109","author":[{"given":"Bocheng","family":"Xu","sequence":"first","affiliation":[{"name":"Peking University,Key Laboratory of Microelectronic Devices and Circuits, School of Integrated Circuits"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jiahao","family":"Song","sequence":"additional","affiliation":[{"name":"Peking University,Key Laboratory of Microelectronic Devices and Circuits, School of Integrated Circuits"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zihan","family":"Wu","sequence":"additional","affiliation":[{"name":"Peking University,Key Laboratory of Microelectronic Devices and Circuits, School of Integrated Circuits"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xiyuan","family":"Tang","sequence":"additional","affiliation":[{"name":"Peking University,Key Laboratory of Microelectronic Devices and Circuits, School of Integrated Circuits"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xiaochen","family":"Bo","sequence":"additional","affiliation":[{"name":"Peking University,Key Laboratory of Microelectronic Devices and Circuits, School of Integrated Circuits"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yuan","family":"Wang","sequence":"additional","affiliation":[{"name":"Peking University,Key Laboratory of Microelectronic Devices and Circuits, School of Integrated Circuits"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TASSP.1984.1164450"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/6.591665"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1093\/oso\/9780195085914.001.0001"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1038\/s42254-022-00440-8"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA57654.2024.00061"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3139901"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3142896"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2024.3376410"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42615.2023.10067504"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3176610"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2024.3352907"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2498601"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2949230"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3062821"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-022-00749-3"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-023-01021-y"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2024.3432799"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/A-SSCC60305.2024.10848963"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2023.3318586"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC49657.2024.10454272"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC49657.2024.10454559"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC49657.2024.10454340"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1038\/s42254-024-00760-x"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2017.2775618"}],"event":{"name":"2026 IEEE International Symposium on Circuits and Systems (ISCAS)","location":"Shanghai, China","start":{"date-parts":[[2026,5,24]]},"end":{"date-parts":[[2026,5,28]]}},"container-title":["2026 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11561899\/11561804\/11562838.pdf?arnumber=11562838","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T05:48:27Z","timestamp":1781848107000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11562838\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,5,24]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/iscas66217.2026.11562838","relation":{},"subject":[],"published":{"date-parts":[[2026,5,24]]}}}