{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T05:53:24Z","timestamp":1781848404633,"version":"3.54.5"},"reference-count":22,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,5,24]],"date-time":"2026-05-24T00:00:00Z","timestamp":1779580800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,5,24]],"date-time":"2026-05-24T00:00:00Z","timestamp":1779580800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100004608","name":"Natural Science Foundation of Jiangsu Province","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004608","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,5,24]]},"DOI":"10.1109\/iscas66217.2026.11563030","type":"proceedings-article","created":{"date-parts":[[2026,6,18]],"date-time":"2026-06-18T20:06:41Z","timestamp":1781813201000},"page":"2490-2494","source":"Crossref","is-referenced-by-count":0,"title":["A Highly-Scalable and Full-Connected SOT P-Bit Ising Annealer for Combinatorial Optimization"],"prefix":"10.1109","author":[{"given":"Huanghui","family":"Wang","sequence":"first","affiliation":[{"name":"Southeast University,School of Integrated Circuits,Nanjing,China,210096"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Haoran","family":"Du","sequence":"additional","affiliation":[{"name":"Southeast University,School of Integrated Circuits,Nanjing,China,210096"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yantong","family":"Di","sequence":"additional","affiliation":[{"name":"Southeast University,School of Integrated Circuits,Nanjing,China,210096"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zeying","family":"Ding","sequence":"additional","affiliation":[{"name":"Southeast University,School of Integrated Circuits,Nanjing,China,210096"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jiongzhe","family":"Su","sequence":"additional","affiliation":[{"name":"Southeast University,School of Integrated Circuits,Nanjing,China,210096"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jingchao","family":"Zhang","sequence":"additional","affiliation":[{"name":"Southeast University,School of Integrated Circuits,Nanjing,China,210096"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Miao","family":"Yu","sequence":"additional","affiliation":[{"name":"Southeast University,School of Integrated Circuits,Nanjing,China,210096"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xin","family":"Si","sequence":"additional","affiliation":[{"name":"Southeast University,School of Integrated Circuits,Nanjing,China,210096"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Bo","family":"Liu","sequence":"additional","affiliation":[{"name":"Southeast University,School of Integrated Circuits,Nanjing,China,210096"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yan","family":"Cui","sequence":"additional","affiliation":[{"name":"Southeast University,School of Integrated Circuits,Nanjing,China,210096"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hao","family":"Cai","sequence":"additional","affiliation":[{"name":"Southeast University,School of Integrated Circuits,Nanjing,China,210096"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.3389\/fphy.2014.00005"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.2307\/2322600"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1038\/nphys2900"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1038\/nature10012"},{"key":"ref5","article-title":"A fully programmable 100-spin coherent Ising machine with all-to-all connections","author":"Metropolics"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1126\/science.aah5178"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1126\/science.aah4243"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC19947.2020.9062965"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3027702"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC19947.2020.9062938"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-024-01182-4"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-020-0436-6"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-024-01228-7"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1038\/s41586-019-1557-9"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM50854.2024.10873318"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-024-47818-z"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2025.3598983"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2025.3571701"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS48785.2022.9937767"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2024.3457533"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2017.2660530"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1038\/s42254-022-00440-8"}],"event":{"name":"2026 IEEE International Symposium on Circuits and Systems (ISCAS)","location":"Shanghai, China","start":{"date-parts":[[2026,5,24]]},"end":{"date-parts":[[2026,5,28]]}},"container-title":["2026 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11561899\/11561804\/11563030.pdf?arnumber=11563030","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T05:33:30Z","timestamp":1781847210000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11563030\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,5,24]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/iscas66217.2026.11563030","relation":{},"subject":[],"published":{"date-parts":[[2026,5,24]]}}}