{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T07:13:59Z","timestamp":1730272439738,"version":"3.28.0"},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,11]]},"DOI":"10.1109\/isce.2017.8355537","type":"proceedings-article","created":{"date-parts":[[2018,5,7]],"date-time":"2018-05-07T18:54:41Z","timestamp":1525719281000},"page":"24-27","source":"Crossref","is-referenced-by-count":0,"title":["Extraction and improvement of IoT service gap between design and operation based on net model"],"prefix":"10.1109","author":[{"given":"Ryosuke","family":"Wada","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Muhammad Syafiq Bin Ab","family":"Malek","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shingo","family":"Yamaguchi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/5.24143"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"1128","DOI":"10.1109\/TKDE.2004.47","article-title":"Workflow mining: discovering process models from event logs","volume":"16","author":"van","year":"2004","journal-title":"IEEE Trans on Knowl and Data Eng"},{"journal-title":"ProM Tools","year":"0","key":"ref6"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.4018\/978-1-5225-0105-3.ch007"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/CIDM.2011.5949453"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1587\/transfun.E99.A.1700"},{"key":"ref1","first-page":"2","article-title":"Advanced technologies for dependable systems through product life cycle by managing gaps among specifications, implementation, and environment","volume":"64","author":"uchihira","year":"2009","journal-title":"Toshiba Review"}],"event":{"name":"2017 IEEE International Symposium on Consumer Electronics (ISCE)","start":{"date-parts":[[2017,11,14]]},"location":"Kuala Lumpur","end":{"date-parts":[[2017,11,15]]}},"container-title":["2017 IEEE International Symposium on Consumer Electronics (ISCE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8353047\/8355528\/08355537.pdf?arnumber=8355537","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,5,21]],"date-time":"2018-05-21T19:56:53Z","timestamp":1526932613000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8355537\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,11]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/isce.2017.8355537","relation":{},"subject":[],"published":{"date-parts":[[2017,11]]}}}