{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T01:54:29Z","timestamp":1725587669089},"reference-count":9,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,3,4]],"date-time":"2020-03-04T00:00:00Z","timestamp":1583280000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,3,4]],"date-time":"2020-03-04T00:00:00Z","timestamp":1583280000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,3,4]],"date-time":"2020-03-04T00:00:00Z","timestamp":1583280000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,3,4]]},"DOI":"10.1109\/isdcs49393.2020.9262980","type":"proceedings-article","created":{"date-parts":[[2020,11,23]],"date-time":"2020-11-23T23:43:10Z","timestamp":1606174990000},"page":"1-5","source":"Crossref","is-referenced-by-count":1,"title":["History Effect on Circuit Performance of SOI-MOSFETs"],"prefix":"10.1109","author":[{"given":"Soumajit","family":"Ghosh","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mitiko","family":"Miura-Mattausch","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Takahiro","family":"Iizuka","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hideyuki","family":"Kikuchihara","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hafizur","family":"Rahaman","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hans Jurgen","family":"Mattausch","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1143\/JJAP.47.2556"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/16.658677"},{"journal-title":"Atlas User s Manual Device Simulation Software","year":"2016","key":"ref6"},{"key":"ref5","first-page":"1013","article-title":"Universal relationship between setting time offloating-body SOI MOSFETs and the substrate current in their coun-terparts","author":"toda","year":"2010","journal-title":"Proc Int Conf Solid State Device Mater"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2286206"},{"journal-title":"HiSIM_SOTB User’s Manual","year":"2017","key":"ref7"},{"key":"ref2","first-page":"1","article-title":"Road to Vmin=0.4V LSIs with least-variability FDSOI and back-bias control","author":"sugii","year":"2011","journal-title":"IEEE International SOI Conference"},{"key":"ref9","first-page":"788","article-title":"Modeling of chain-history effect based on HiSIM-SOI","author":"fukunaga","year":"2012","journal-title":"Proc NSTI"},{"key":"ref1","first-page":"631","article-title":"Silicon on thin BOX:A new paradigm of the CMOSFET for low-power and high-performanceapplication featuring wide-range back-bias control","author":"tsuchiya","year":"2004","journal-title":"Tech Dig IEDM"}],"event":{"name":"2020 International Symposium on Devices, Circuits and Systems (ISDCS)","start":{"date-parts":[[2020,3,4]]},"location":"Howrah, India","end":{"date-parts":[[2020,3,6]]}},"container-title":["2020 International Symposium on Devices, Circuits and Systems (ISDCS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9262967\/9262968\/09262980.pdf?arnumber=9262980","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,28]],"date-time":"2022-06-28T21:54:35Z","timestamp":1656453275000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9262980\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,3,4]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/isdcs49393.2020.9262980","relation":{},"subject":[],"published":{"date-parts":[[2020,3,4]]}}}