{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T19:24:41Z","timestamp":1725391481381},"reference-count":5,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,12]]},"DOI":"10.1109\/isicir.2014.7029443","type":"proceedings-article","created":{"date-parts":[[2015,2,10]],"date-time":"2015-02-10T14:52:27Z","timestamp":1423579947000},"page":"412-415","source":"Crossref","is-referenced-by-count":1,"title":["Parasitic BJT versus DIBL: Floating-body-related subthreshold characteristics of SOI NMOS device"],"prefix":"10.1109","author":[{"given":"D. H.","family":"Lung","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S. K.","family":"Hu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J. B.","family":"Kuo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.","family":"Chen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Y. J.","family":"Chen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2011.11.013"},{"journal-title":"Modeling the Floating Body Effect of PD SOI NMOS Device","year":"0","author":"su","key":"2"},{"journal-title":"Low-Voltage SOI CMOS Devices and Circuits","year":"2004","author":"kuo","key":"1"},{"journal-title":"Synopsys Version E-2010 12","year":"0","key":"5"},{"key":"4","first-page":"1558","article-title":"Sti induced mechanical-stress-related kink effect behavior of pd soi nmos device","author":"lin","year":"2008","journal-title":"IEEE Trans Electron Devices"}],"event":{"name":"2014 International Symposium on Integrated Circuits (ISIC)","start":{"date-parts":[[2014,12,10]]},"location":"Singapore","end":{"date-parts":[[2014,12,12]]}},"container-title":["2014 International Symposium on Integrated Circuits (ISIC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7005969\/7029433\/07029443.pdf?arnumber=7029443","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T01:49:50Z","timestamp":1490320190000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7029443\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,12]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/isicir.2014.7029443","relation":{},"subject":[],"published":{"date-parts":[[2014,12]]}}}