{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T03:37:55Z","timestamp":1729654675108,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,12]]},"DOI":"10.1109\/isicir.2014.7029453","type":"proceedings-article","created":{"date-parts":[[2015,2,10]],"date-time":"2015-02-10T09:52:27Z","timestamp":1423561947000},"page":"524-527","source":"Crossref","is-referenced-by-count":1,"title":["A more accurate circuit model for CMOS Hall cross with non-linear resistors and JFETs"],"prefix":"10.1109","author":[{"given":"Fei","family":"Lyu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhenduo","family":"Zhu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhenfei","family":"Lu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Li","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jin","family":"Sha","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hongbing","family":"Pan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yutong","family":"Bi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"crossref","first-page":"314","DOI":"10.1016\/S0924-4247(03)00192-4","article-title":"Micro-Hall devices: Performance, technologies and applications","volume":"106","author":"boero","year":"2003","journal-title":"Sensors and Actuators A Physical"},{"journal-title":"Hall-Effect Sensors Theory and Application","year":"2006","author":"ramsden","key":"2"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.3390\/s110606284"},{"key":"1","doi-asserted-by":"crossref","DOI":"10.1887\/0750308559","author":"popovic","year":"2004","journal-title":"Hall Effect Devices"},{"key":"7","first-page":"235","article-title":"3D simulation of crossshaped Hall sensor and its equivalent circuit model","volume":"1","author":"jovanovic","year":"2004","journal-title":"24th International Conference on Microelectronics"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/BMAS.2002.1291051"},{"key":"5","doi-asserted-by":"crossref","first-page":"501","DOI":"10.1109\/43.75633","article-title":"Numerical analysis of magnetic-field-sensitive bipolar devices","volume":"10","author":"allegretto","year":"2002","journal-title":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"},{"key":"4","doi-asserted-by":"crossref","first-page":"1212","DOI":"10.1109\/T-ED.1985.22103","article-title":"two-dimensional numerical modeling of magnetic-field sensors in cmos technology","volume":"32","author":"nathan","year":"1985","journal-title":"IEEE Transactions on Electron Devices"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2007.11.030"},{"key":"8","doi-asserted-by":"crossref","first-page":"422","DOI":"10.1016\/j.sse.2006.01.001","article-title":"A new model for fourterminal junction field-effect transistors","volume":"50","author":"hao","year":"2006","journal-title":"Solid-State Electronics"},{"key":"11","doi-asserted-by":"crossref","first-page":"355","DOI":"10.1007\/s10470-013-0188-6","article-title":"Temperature considerations on Hall Effect sensors current-related sensitivity behaviour","volume":"77","author":"paun","year":"2011","journal-title":"Analog Integrated Circuits and Signal Processing"},{"journal-title":"Temperature Considerations on Hall Effect Sensors Current-related Sensitivity Behaviour","year":"2003","author":"demierre","key":"12"}],"event":{"name":"2014 International Symposium on Integrated Circuits (ISIC)","start":{"date-parts":[[2014,12,10]]},"location":"Singapore","end":{"date-parts":[[2014,12,12]]}},"container-title":["2014 International Symposium on Integrated Circuits (ISIC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7005969\/7029433\/07029453.pdf?arnumber=7029453","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,23]],"date-time":"2017-06-23T01:16:38Z","timestamp":1498180598000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7029453\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,12]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/isicir.2014.7029453","relation":{},"subject":[],"published":{"date-parts":[[2014,12]]}}}