{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T17:31:16Z","timestamp":1777656676623,"version":"3.51.4"},"reference-count":28,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,6]]},"DOI":"10.1109\/isie.2015.7281657","type":"proceedings-article","created":{"date-parts":[[2015,10,1]],"date-time":"2015-10-01T17:54:18Z","timestamp":1443722058000},"page":"1284-1289","source":"Crossref","is-referenced-by-count":22,"title":["Low temperature aging tests for lithium-ion batteries"],"prefix":"10.1109","author":[{"given":"J.","family":"Jaguemont","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"L.","family":"Boulon","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.","family":"Venet","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Y.","family":"Dube","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Sari","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2010.11.134"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2013.12.060"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2005.01.006"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/S0378-7753(01)00670-X"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1149\/1.1393622"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/S0013-4686(02)00620-5"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1149\/1.1393625"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2008.01.028"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/S0378-7753(01)00722-4"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.elecom.2011.07.014"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2014.03.112"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VPPC.2011.6043069"},{"key":"ref27","first-page":"1","article-title":"Temperature Effect on Electric Vehicle Battery Cycle Life in Vehicle-to-Grid Applications","author":"qian","year":"2010","journal-title":"Electr Distrib (CICED) 2010 China Int Conf Electr Distrib"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2011.2122272"},{"key":"ref6","article-title":"Recycling of Li-Ion Batteries","author":"gaines","year":"2011","journal-title":"Argonne National Laboratory"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"37","DOI":"10.1149\/2.F03122if","article-title":"A General Discussion of Li Ion Battery Safety","volume":"21","author":"doughty","year":"2012","journal-title":"Electrochem Soc Interface"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1149\/2.047304jes"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ESARS.2012.6387434"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2010.2049652"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2015.2391053"},{"key":"ref1","author":"linden","year":"2002","journal-title":"Handbook of Batteries"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2003.09.008"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.electacta.2014.08.115"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/VPPC.2014.7007097"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/S0378-7753(03)00029-6"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2011.2168987"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2012.2206415"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2014.04.092"}],"event":{"name":"2015 IEEE 24th International Symposium on Industrial Electronics (ISIE)","location":"Buzios, Rio de Janeiro, Brazil","start":{"date-parts":[[2015,6,3]]},"end":{"date-parts":[[2015,6,5]]}},"container-title":["2015 IEEE 24th International Symposium on Industrial Electronics (ISIE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7268961\/7281431\/07281657.pdf?arnumber=7281657","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,8,31]],"date-time":"2019-08-31T01:08:42Z","timestamp":1567213722000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7281657\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,6]]},"references-count":28,"URL":"https:\/\/doi.org\/10.1109\/isie.2015.7281657","relation":{},"subject":[],"published":{"date-parts":[[2015,6]]}}}