{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,27]],"date-time":"2025-10-27T10:49:38Z","timestamp":1761562178279},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,6]]},"DOI":"10.1109\/isie.2016.7744904","type":"proceedings-article","created":{"date-parts":[[2016,11,30]],"date-time":"2016-11-30T16:14:30Z","timestamp":1480522470000},"page":"286-291","source":"Crossref","is-referenced-by-count":6,"title":["State of charge estimation of LiFePO<inf>4<\/inf> batteries with temperature variations using neural networks"],"prefix":"10.1109","author":[{"given":"Hicham","family":"Chaoui","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chinemerem Christopher","family":"Ibe-Ekeocha","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Asmae","family":"El Mejdoubi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Amrane","family":"Oukaour","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hamid","family":"Gualous","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Noshin","family":"Omar","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2043035"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2007.896496"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2007.895457"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2013.2259490"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2024657"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2013.2259490"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2341576"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2004.842461"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2437634"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2014.2382635"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2012.2223700"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2014.2321028"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPS.2015.2403301"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2012.2222684"}],"event":{"name":"2016 IEEE 25th International Symposium on Industrial Electronics (ISIE)","start":{"date-parts":[[2016,6,8]]},"location":"Santa Clara, CA, USA","end":{"date-parts":[[2016,6,10]]}},"container-title":["2016 IEEE 25th International Symposium on Industrial Electronics (ISIE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7740453\/7744853\/07744904.pdf?arnumber=7744904","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,12,17]],"date-time":"2016-12-17T08:53:36Z","timestamp":1481964816000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7744904\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,6]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/isie.2016.7744904","relation":{},"subject":[],"published":{"date-parts":[[2016,6]]}}}