{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,4]],"date-time":"2025-09-04T14:17:49Z","timestamp":1756995469135},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,6]]},"DOI":"10.1109\/isie.2016.7745074","type":"proceedings-article","created":{"date-parts":[[2016,11,30]],"date-time":"2016-11-30T11:14:30Z","timestamp":1480504470000},"source":"Crossref","is-referenced-by-count":8,"title":["Measurement of three-dimensional deformation and load using vision-based tactile sensor"],"prefix":"10.1109","author":[{"family":"Feng Guo","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Chun Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Yan Yan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Peiyi Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Zhihua Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TOH.2009.47"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IROS.2015.7353570"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1023\/A:1007905828438"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2010.2104316"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP.2008.4712056"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICRA.2015.7139016"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2010.5540089"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.1987.4767940"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2009.5206534"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ROBOT.2010.5509295"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/BF02028349"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ARIS.2013.6573549"}],"event":{"name":"2016 IEEE 25th International Symposium on Industrial Electronics (ISIE)","location":"Santa Clara, CA, USA","start":{"date-parts":[[2016,6,8]]},"end":{"date-parts":[[2016,6,10]]}},"container-title":["2016 IEEE 25th International Symposium on Industrial Electronics (ISIE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7740453\/7744853\/07745074.pdf?arnumber=7745074","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,12,7]],"date-time":"2016-12-07T12:36:05Z","timestamp":1481114165000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7745074\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,6]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/isie.2016.7745074","relation":{},"subject":[],"published":{"date-parts":[[2016,6]]}}}