{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,16]],"date-time":"2025-10-16T20:31:23Z","timestamp":1760646683914},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,6]]},"DOI":"10.1109\/isie.2017.8001451","type":"proceedings-article","created":{"date-parts":[[2017,8,9]],"date-time":"2017-08-09T20:27:37Z","timestamp":1502310457000},"page":"1404-1411","source":"Crossref","is-referenced-by-count":9,"title":["Prism signal processing for sensor condition monitoring"],"prefix":"10.1109","author":[{"given":"Manus","family":"Henry","sequence":"first","affiliation":[]},{"given":"Oleg Yu.","family":"Bushuev","sequence":"additional","affiliation":[]},{"given":"Olga L.","family":"Ibryaeva","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/0967-0661(93)91382-7"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2003.1160055"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2012.6256374"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2013.6699121"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2010.04.004"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2008.2011949"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1108\/02602280710723488"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2016.2523639"},{"key":"ref9","article-title":"Detecting changes in the condition of a pressure transucer by analysing its output signal","author":"yu bushuev","year":"2012","journal-title":"X IMEKO World Congress"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2014.2300753"}],"event":{"name":"2017 IEEE 26th International Symposium on Industrial Electronics (ISIE)","start":{"date-parts":[[2017,6,19]]},"location":"Edinburgh, United Kingdom","end":{"date-parts":[[2017,6,21]]}},"container-title":["2017 IEEE 26th International Symposium on Industrial Electronics (ISIE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7994774\/8000791\/08001451.pdf?arnumber=8001451","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,8,23]],"date-time":"2017-08-23T23:55:08Z","timestamp":1503532508000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8001451\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,6]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/isie.2017.8001451","relation":{},"subject":[],"published":{"date-parts":[[2017,6]]}}}