{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,10]],"date-time":"2026-02-10T18:27:59Z","timestamp":1770748079869,"version":"3.49.0"},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,6]]},"DOI":"10.1109\/isie.2019.8781344","type":"proceedings-article","created":{"date-parts":[[2019,8,1]],"date-time":"2019-08-01T23:55:47Z","timestamp":1564703747000},"page":"1911-1916","source":"Crossref","is-referenced-by-count":3,"title":["An Online Impedance Processing Method for Fuel Cell EIS Measurements Enabling Degradation Information Extraction"],"prefix":"10.1109","author":[{"given":"Jiabin","family":"Shen","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hooman","family":"Homayouni","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jiacheng","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","article-title":"Contribution to prognostics of PEM fuel cells: approaches based on degradation information at multiple levels","author":"zhang","year":"2018","journal-title":"Automatic Communaut&#x00E9; Universit&#x00E9; Grenoble Alpes"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2012.2214411"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2463770"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2012.2198680"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2015.2456232"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2016.2618886"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2014.07.157"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2007.898389"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2017.05.021"},{"key":"ref19","year":"2014","journal-title":"2014 IEEE PHM Data Challenge"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2406051"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2418324"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijhydene.2016.02.010"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2014.2376529"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijhydene.2017.06.180"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2519328"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijhydene.2007.03.013"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2017.2723561"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.energy.2018.02.016"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2005.11.035"}],"event":{"name":"2019 IEEE 28th International Symposium on Industrial Electronics (ISIE)","location":"Vancouver, BC, Canada","start":{"date-parts":[[2019,6,12]]},"end":{"date-parts":[[2019,6,14]]}},"container-title":["2019 IEEE 28th International Symposium on Industrial Electronics (ISIE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8767359\/8781085\/08781344.pdf?arnumber=8781344","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,18]],"date-time":"2022-07-18T15:26:29Z","timestamp":1658157989000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8781344\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,6]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/isie.2019.8781344","relation":{},"subject":[],"published":{"date-parts":[[2019,6]]}}}