{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,16]],"date-time":"2025-10-16T06:59:31Z","timestamp":1760597971408},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,6]]},"DOI":"10.1109\/isie45063.2020.9152255","type":"proceedings-article","created":{"date-parts":[[2020,7,31]],"date-time":"2020-07-31T00:49:41Z","timestamp":1596156581000},"page":"185-190","source":"Crossref","is-referenced-by-count":6,"title":["Phase effect in frequency measurements of a quartz crystal using the pulse coincidence principle"],"prefix":"10.1109","author":[{"given":"Fabian N.","family":"Murrieta-Rico","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vitalii","family":"Petranovskii","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Donald H.","family":"Galvan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Oleg","family":"Sergiyenko","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Joel","family":"Antunez-Garcia","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rosario I.","family":"Yocupicio-Gaxiola","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Juan","family":"de Dios Sanchez-Lopez","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.3390\/s131115785"},{"key":"ref11","first-page":"139","article-title":"New frequency counting principle improves resolution","author":"johansson","year":"2006","journal-title":"Proceedings of the 20th European Frequency and Time Forum EFTF"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/78.869059"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2008.04.009"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2011.2166114"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.ifacol.2015.05.060"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1177\/1729881419869727"},{"journal-title":"Crystal Oscillator Design and Temperature Compensation","year":"2012","author":"frerking","key":"ref17"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2016.02.032"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2018.05.008"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/BF01337937"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.4018\/978-1-5225-9924-1.ch002"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/19\/11\/115206"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2004.05.054"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/S0925-4005(02)00132-6"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/14\/11\/005"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2018.8591377"},{"journal-title":"Principles of Measurement Systems","year":"2005","author":"bentley","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2019.8927337"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2018.05.025"}],"event":{"name":"2020 IEEE 29th International Symposium on Industrial Electronics (ISIE)","start":{"date-parts":[[2020,6,17]]},"location":"Delft, Netherlands","end":{"date-parts":[[2020,6,19]]}},"container-title":["2020 IEEE 29th International Symposium on Industrial Electronics (ISIE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9145944\/9152187\/09152255.pdf?arnumber=9152255","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,28]],"date-time":"2022-06-28T21:50:33Z","timestamp":1656453033000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9152255\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,6]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/isie45063.2020.9152255","relation":{},"subject":[],"published":{"date-parts":[[2020,6]]}}}