{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,21]],"date-time":"2026-01-21T06:33:37Z","timestamp":1768977217140,"version":"3.49.0"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,6]]},"DOI":"10.1109\/isie45063.2020.9152407","type":"proceedings-article","created":{"date-parts":[[2020,7,31]],"date-time":"2020-07-31T00:49:41Z","timestamp":1596156581000},"page":"505-509","source":"Crossref","is-referenced-by-count":3,"title":["Modeling and Predicting an Industrial Process Using a Neural Network and Automation Data"],"prefix":"10.1109","author":[{"given":"Mikko","family":"Nykyri","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mikko","family":"Kuisma","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jukka","family":"Hallikas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mika","family":"Immonen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pertti","family":"Silventoinen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1186\/s13634-016-0355-x"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2019.8781216"},{"key":"ref12","author":"han","year":"2012","journal-title":"Data Mining Concepts and Techniques"},{"key":"ref13","article-title":"Big data analytics in the cloud:spark on hadoop vs mpi\/openmp on beowulf","author":"reyes-ortiz","year":"2015","journal-title":"INNS Conference on Big Data 2015"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ETFA.2018.8502484"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/UBMK.2017.8093521"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/MIPRO.2014.6859735"},{"key":"ref17","author":"g\u00e9ron","year":"2017","journal-title":"Hands-On Machine Learning With Scikit-Learn and Tensor Flow"},{"key":"ref18","year":"2019","journal-title":"Global market share of cloud infrastructure services from 2017 to 2019 by vendor-synergy research group Statista estimates"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2014.2349359"},{"key":"ref3","author":"wendler","year":"2016","journal-title":"Data Mining with SPSS Modeler Theory Exercises and Solutions"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2872799"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MIS.2017.49"},{"key":"ref8","author":"anderson","year":"2017","journal-title":"The Industrial Internet of Things Volume T3 Analytics Framework"},{"key":"ref7","author":"mitchell","year":"1997","journal-title":"Machine Learning"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/WSC.2017.8248104"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/LISS.2016.7854550"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/APSEC.2018.00015"}],"event":{"name":"2020 IEEE 29th International Symposium on Industrial Electronics (ISIE)","location":"Delft, Netherlands","start":{"date-parts":[[2020,6,17]]},"end":{"date-parts":[[2020,6,19]]}},"container-title":["2020 IEEE 29th International Symposium on Industrial Electronics (ISIE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9145944\/9152187\/09152407.pdf?arnumber=9152407","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,28]],"date-time":"2022-06-28T21:50:56Z","timestamp":1656453056000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9152407\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,6]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/isie45063.2020.9152407","relation":{},"subject":[],"published":{"date-parts":[[2020,6]]}}}