{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T02:59:56Z","timestamp":1725677996322},"reference-count":28,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,6,19]],"date-time":"2023-06-19T00:00:00Z","timestamp":1687132800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,6,19]],"date-time":"2023-06-19T00:00:00Z","timestamp":1687132800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,6,19]]},"DOI":"10.1109\/isie51358.2023.10228064","type":"proceedings-article","created":{"date-parts":[[2023,8,31]],"date-time":"2023-08-31T17:30:24Z","timestamp":1693503024000},"page":"1-8","source":"Crossref","is-referenced-by-count":0,"title":["Fault Detection, Localization and Clearance for MMC based on Indirect Finite Control Set Model Predictive Control"],"prefix":"10.1109","author":[{"given":"Saad","family":"Hamayoon","sequence":"first","affiliation":[{"name":"Norwegian University of Science and Technology,Department of Engineering Cybernetics,Trondheim,Norway"}]},{"given":"Morten","family":"Hovd","sequence":"additional","affiliation":[{"name":"Norwegian University of Science and Technology,Department of Engineering Cybernetics,Trondheim,Norway"}]},{"given":"Jon Are","family":"Suul","sequence":"additional","affiliation":[{"name":"Norwegian University of Science and Technology,Department of Engineering Cybernetics,Trondheim,Norway"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2013.2264950"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2284919"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2526684"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2756849"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2305663"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2012.2190530"},{"journal-title":"Modular Multilevel Converters Analysis Control and Applications","year":"2018","author":"sixing","key":"ref2"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/9781118851555"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2020.2967576"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2015.2477476"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3028808"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2823659"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/eGRID48402.2019.9092734"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2883989"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2018.2880137"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/PEAC.2018.8590218"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.2997963"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2019.2911959"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2928248"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/COMPEL52922.2021.9646053"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/COMPEL49091.2020.9265860"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2628762"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/08IAS.2008.349"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2454534"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2327641"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/PTC.2003.1304403"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2796584"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2010.2050787"}],"event":{"name":"2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE)","start":{"date-parts":[[2023,6,19]]},"location":"Helsinki, Finland","end":{"date-parts":[[2023,6,21]]}},"container-title":["2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10227852\/10227910\/10228064.pdf?arnumber=10228064","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,9,25]],"date-time":"2023-09-25T17:52:40Z","timestamp":1695664360000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10228064\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,6,19]]},"references-count":28,"URL":"https:\/\/doi.org\/10.1109\/isie51358.2023.10228064","relation":{},"subject":[],"published":{"date-parts":[[2023,6,19]]}}}