{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:43:05Z","timestamp":1740102185636,"version":"3.37.3"},"reference-count":5,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,6,19]],"date-time":"2023-06-19T00:00:00Z","timestamp":1687132800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,6,19]],"date-time":"2023-06-19T00:00:00Z","timestamp":1687132800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100000780","name":"European Commission","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100000780","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,6,19]]},"DOI":"10.1109\/isie51358.2023.10228154","type":"proceedings-article","created":{"date-parts":[[2023,8,31]],"date-time":"2023-08-31T17:30:24Z","timestamp":1693503024000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["Developing a Test Suite for Evaluating IEC 61499 Application Portability"],"prefix":"10.1109","author":[{"given":"Midhun","family":"Xavier","sequence":"first","affiliation":[{"name":"Lulea Tekniska Universitet,Computer and Space Engineering,Department of Computer Science,Sweden"}]},{"given":"Tatiana","family":"Laikh","sequence":"additional","affiliation":[{"name":"Lulea Tekniska Universitet,Computer and Space Engineering,Department of Computer Science,Sweden"}]},{"given":"Sandeep","family":"Patil","sequence":"additional","affiliation":[{"name":"Lulea Tekniska Universitet,Computer and Space Engineering,Department of Computer Science,Sweden"}]},{"given":"Valeriy","family":"Vyatkin","sequence":"additional","affiliation":[{"name":"Lulea Tekniska Universitet,Computer and Space Engineering,Department of Computer Science,Sweden"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/INDIN.2014.6945553"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ETFA.2013.6648136"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2019.8781290"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3182\/20100701-2-PT-4011.00006"},{"year":"2012","key":"ref1","article-title":"IEC 61499-1: Function Blocks Part 1: Architecture"}],"event":{"name":"2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE)","start":{"date-parts":[[2023,6,19]]},"location":"Helsinki, Finland","end":{"date-parts":[[2023,6,21]]}},"container-title":["2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10227852\/10227910\/10228154.pdf?arnumber=10228154","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,9,25]],"date-time":"2023-09-25T17:52:41Z","timestamp":1695664361000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10228154\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,6,19]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/isie51358.2023.10228154","relation":{},"subject":[],"published":{"date-parts":[[2023,6,19]]}}}