{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T07:49:17Z","timestamp":1730274557524,"version":"3.28.0"},"reference-count":28,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,6,19]],"date-time":"2023-06-19T00:00:00Z","timestamp":1687132800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,6,19]],"date-time":"2023-06-19T00:00:00Z","timestamp":1687132800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,6,19]]},"DOI":"10.1109\/isie51358.2023.10228157","type":"proceedings-article","created":{"date-parts":[[2023,8,31]],"date-time":"2023-08-31T17:30:24Z","timestamp":1693503024000},"page":"1-7","source":"Crossref","is-referenced-by-count":0,"title":["Comparative Study of Excitation Signals for Active Fault Diagnosis of Belt Drives"],"prefix":"10.1109","author":[{"given":"Moritz","family":"Fehsenfeld","sequence":"first","affiliation":[{"name":"Leibniz University,Institute of Mechatronic Systems,Hannover,Germany"}]},{"given":"Johannes","family":"K\u00fchn","sequence":"additional","affiliation":[{"name":"Lenze SE,Germany"}]},{"given":"Karl-Philipp","family":"Kortmann","sequence":"additional","affiliation":[{"name":"Leibniz University,Institute of Mechatronic Systems,Hannover,Germany"}]}],"member":"263","reference":[{"key":"ref13","article-title":"The great time series classification bake off: a review and experimental evaluation of recent algorithmic advances","author":"bagnall","year":"2016","journal-title":"Data Mining and Knowledge Discovery"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-12767-0"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.ifacol.2018.09.726"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s10618-019-00619-1"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.5755\/j02.mech.24401"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2012.07.018"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1155\/2020\/8843759"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/s11831-018-9286-z"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.ifacol.2020.12.824"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.arcontrol.2019.03.002"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1137\/1.9781611972740.2"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JAS.2019.1911747"},{"key":"ref24","doi-asserted-by":"crossref","first-page":"5","DOI":"10.1023\/A:1010933404324","article-title":"Random forests","volume":"45","author":"breiman","year":"2001","journal-title":"Machine Learning"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2018.03.067"},{"key":"ref26","article-title":"dentification of Dynamic Systems","author":"isermann","year":"2011","journal-title":"Springer Berlin Heidelberg"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-47439-3"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/3447548.3467231"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/s10618-019-00647-x"},{"article-title":"An Introduction to Statistical Learning: With Applications","year":"2014","author":"james","key":"ref21"},{"key":"ref28","article-title":"sktime: A Unified Interface for Machine Learning with Time Series","author":"l\u00f6ning","year":"2019","journal-title":"arXiv 1909 07872"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.1970.1054411"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ETFA.2019.8869067"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.5220\/0011287200003271"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3390\/en12081438"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1177\/1475921716652582"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.proeng.2016.05.131"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2017.2661317"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.cirpj.2011.08.002"}],"event":{"name":"2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE)","start":{"date-parts":[[2023,6,19]]},"location":"Helsinki, Finland","end":{"date-parts":[[2023,6,21]]}},"container-title":["2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10227852\/10227910\/10228157.pdf?arnumber=10228157","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,9,25]],"date-time":"2023-09-25T17:52:45Z","timestamp":1695664365000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10228157\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,6,19]]},"references-count":28,"URL":"https:\/\/doi.org\/10.1109\/isie51358.2023.10228157","relation":{},"subject":[],"published":{"date-parts":[[2023,6,19]]}}}