{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,18]],"date-time":"2025-04-18T05:27:49Z","timestamp":1744954069336},"reference-count":9,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,6,1]],"date-time":"2022-06-01T00:00:00Z","timestamp":1654041600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,6,1]],"date-time":"2022-06-01T00:00:00Z","timestamp":1654041600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,6,1]]},"DOI":"10.1109\/isie51582.2022.9831533","type":"proceedings-article","created":{"date-parts":[[2022,7,25]],"date-time":"2022-07-25T20:19:13Z","timestamp":1658780353000},"page":"623-626","source":"Crossref","is-referenced-by-count":3,"title":["A novel SEU injection setup for Automotive SoC"],"prefix":"10.1109","author":[{"given":"G.","family":"Iaria","sequence":"first","affiliation":[{"name":"Politecnico di Torino,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.","family":"Foscale","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.","family":"Bernardi","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"L.","family":"Presicce","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M. Sonza","family":"Reorda","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.","family":"Appello","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"V.","family":"Tancorre","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R.","family":"Ugioli","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IPDPSW.2012.32"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2013.6523654"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICASID.2018.8693114"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI.2008.28"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DFT52944.2021.9568350"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ReCoSoC.2016.7533907"},{"volume-title":"Universal Verification Methodology (UVM) 1.2 users guide","key":"ref7"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2005.860689"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ECS.2017.8067859"}],"event":{"name":"2022 IEEE 31st International Symposium on Industrial Electronics (ISIE)","start":{"date-parts":[[2022,6,1]]},"location":"Anchorage, AK, USA","end":{"date-parts":[[2022,6,3]]}},"container-title":["2022 IEEE 31st International Symposium on Industrial Electronics (ISIE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9831187\/9831454\/09831533.pdf?arnumber=9831533","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T06:17:57Z","timestamp":1706768277000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9831533\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,6,1]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/isie51582.2022.9831533","relation":{},"subject":[],"published":{"date-parts":[[2022,6,1]]}}}