{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T12:03:52Z","timestamp":1725797032624},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,6,18]],"date-time":"2024-06-18T00:00:00Z","timestamp":1718668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,6,18]],"date-time":"2024-06-18T00:00:00Z","timestamp":1718668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,6,18]]},"DOI":"10.1109\/isie54533.2024.10595757","type":"proceedings-article","created":{"date-parts":[[2024,7,19]],"date-time":"2024-07-19T17:30:49Z","timestamp":1721410249000},"page":"1-7","source":"Crossref","is-referenced-by-count":0,"title":["Secondary Fault Identification Method Based on the Extremely Low Frequency Current Measurement"],"prefix":"10.1109","author":[{"given":"Shiwu","family":"Yang","sequence":"first","affiliation":[{"name":"Huazhong University of Science and Technology,School of Artificial Intelligence and Automation,Wuhan,China"}]},{"given":"Qing","family":"Chen","sequence":"additional","affiliation":[{"name":"Huazhong University of Science and Technology,School of Electric and Electronic Engineering,Wuhan,China"}]},{"given":"Hongbin","family":"Li","sequence":"additional","affiliation":[{"name":"Huazhong University of Science and Technology,School of Artificial Intelligence and Automation,Wuhan,China"}]},{"given":"Yang","family":"Jiao","sequence":"additional","affiliation":[{"name":"Huazhong University of Science and Technology,School of Electric and Electronic Engineering,Wuhan,China"}]},{"given":"Ruoyan","family":"Tian","sequence":"additional","affiliation":[{"name":"Huazhong University of Science and Technology,School of Electric and Electronic Engineering,Wuhan,China"}]},{"given":"Yuxiang","family":"He","sequence":"additional","affiliation":[{"name":"Huazhong University of Science and Technology,School of Electric and Electronic Engineering,Wuhan,China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3238072"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2012.2192456"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2016.2601075"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.35833\/MPCE.2018.000750"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2021.3091646"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.23919\/AEIT.2017.8240493"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2010.0351"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.35833\/MPCE.2020.000466"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2008.917924"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2006.11.009"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2019.04.050"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2994139"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1049\/gtd2.12071"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IDITR54676.2022.9796492"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/EI2.2017.8245233"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/PSGEC51302.2021.9541783"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.egyr.2022.10.070"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2776238"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2008.4547234"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.3036632"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3244217"}],"event":{"name":"2024 IEEE 33rd International Symposium on Industrial Electronics (ISIE)","start":{"date-parts":[[2024,6,18]]},"location":"Ulsan, Korea, Republic of","end":{"date-parts":[[2024,6,21]]}},"container-title":["2024 IEEE 33rd International Symposium on Industrial Electronics (ISIE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10595551\/10595675\/10595757.pdf?arnumber=10595757","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,7,21]],"date-time":"2024-07-21T04:16:32Z","timestamp":1721535392000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10595757\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,6,18]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/isie54533.2024.10595757","relation":{},"subject":[],"published":{"date-parts":[[2024,6,18]]}}}