{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,13]],"date-time":"2026-03-13T04:59:47Z","timestamp":1773377987503,"version":"3.50.1"},"reference-count":8,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,7,12]],"date-time":"2021-07-12T00:00:00Z","timestamp":1626048000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,7,12]],"date-time":"2021-07-12T00:00:00Z","timestamp":1626048000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,7,12]]},"DOI":"10.1109\/isit45174.2021.9517764","type":"proceedings-article","created":{"date-parts":[[2021,9,1]],"date-time":"2021-09-01T16:52:42Z","timestamp":1630515162000},"page":"2918-2923","source":"Crossref","is-referenced-by-count":2,"title":["Selector Failure Detection for Resistive Random Access Memories"],"prefix":"10.1109","author":[{"given":"Guanghui","family":"Song","sequence":"first","affiliation":[{"name":"Singapore University of Technology and Design,Singapore"}]},{"given":"Kui","family":"Cai","sequence":"additional","affiliation":[{"name":"Singapore University of Technology and Design,Singapore"}]},{"given":"Ce","family":"Sun","sequence":"additional","affiliation":[{"name":"Beijing Institute of Technology,Beijing,China"}]},{"given":"Xingwei","family":"Zhong","sequence":"additional","affiliation":[{"name":"Singapore University of Technology and Design,Singapore"}]},{"given":"Jun","family":"Cheng","sequence":"additional","affiliation":[{"name":"Doshisha University,Kyoto,Japan"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2021.3051413"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2019.2897762"},{"key":"ref6","author":"song","year":"0","journal-title":"Near-optimal detection for both data and sneak-path interference in resistive memories with random cell selector failures"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2019.2948332"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2012.2190369"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2184544"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2016.2594798"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2012.10.001"}],"event":{"name":"2021 IEEE International Symposium on Information Theory (ISIT)","location":"Melbourne, Australia","start":{"date-parts":[[2021,7,12]]},"end":{"date-parts":[[2021,7,20]]}},"container-title":["2021 IEEE International Symposium on Information Theory (ISIT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9517708\/9517709\/09517764.pdf?arnumber=9517764","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,3,12]],"date-time":"2026-03-12T20:35:47Z","timestamp":1773347747000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9517764\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,7,12]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/isit45174.2021.9517764","relation":{},"subject":[],"published":{"date-parts":[[2021,7,12]]}}}