{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T08:01:31Z","timestamp":1730275291386,"version":"3.28.0"},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,11,17]],"date-time":"2023-11-17T00:00:00Z","timestamp":1700179200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,11,17]],"date-time":"2023-11-17T00:00:00Z","timestamp":1700179200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,11,17]]},"DOI":"10.1109\/iske60036.2023.10480941","type":"proceedings-article","created":{"date-parts":[[2024,4,8]],"date-time":"2024-04-08T20:33:29Z","timestamp":1712608409000},"page":"275-279","source":"Crossref","is-referenced-by-count":0,"title":["Temperature Drift Compensation of Light Scattering PM Sensor Based on BP Neural Network"],"prefix":"10.1109","author":[{"given":"Zhicong","family":"Shen","sequence":"first","affiliation":[{"name":"Midea Refrigeration Equipment Co., Ltd,R&D Department,Foshan,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Junying","family":"Niu","sequence":"additional","affiliation":[{"name":"Intelligent Manufacturing School, Shunde Polytechnic,Foshan,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zongzheng","family":"You","sequence":"additional","affiliation":[{"name":"China Telecom Co., Ltd,Department of Wireless Network,Foshan,China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"issue":"5","key":"ref1","first-page":"880","article-title":"Study of temperature characteristics of semiconductor lasers based on the rate equation[J]","volume":"39","author":"He","year":"2019","journal-title":"Applied Lasers"},{"issue":"4","key":"ref2","first-page":"360","article-title":"Accelerated lifetime test method for high-power semiconductor lasers[J]","volume":"33","author":"Baohui","year":"2008","journal-title":"Semiconductor Technology"},{"volume-title":"Research on degradation mechanism and embedded test technology of semiconductor lasers[D]","year":"2016","author":"Guishan","key":"ref3"},{"issue":"1","key":"ref4","first-page":"45","article-title":"Effect of temperature on the degradation of semiconductor lasers[J]","volume":"42","author":"Peng","year":"2020","journal-title":"Journal of the National University of Defense Technology"},{"issue":"004","key":"ref5","first-page":"562","article-title":"Temperature compensation method for piezoresistive sensors based on segment fusion[J]","volume":"31","author":"Wang","year":"2018","journal-title":"Journal of Sensing Technology"},{"key":"ref6","first-page":"185","article-title":"Improving sensor characteristics using BP neural network and its improvement algorithm[J]","volume":"03","author":"Zhang","year":"2002","journal-title":"Journal of Sensing Technology"},{"key":"ref7","first-page":"153","article-title":"Temperature compensation of humidity sensor based on improved GA-BP neural network[J]","volume":"01","author":"Peng","year":"2013","journal-title":"Journal of Instrumentation"},{"issue":"002","key":"ref8","first-page":"358","article-title":"Temperature compensation of pressure sensors based on artificial neural networks[J]","volume":"36","author":"Yaofeng","year":"2008","journal-title":"Journal of Electronics"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3390\/s18072176"},{"key":"ref10","article-title":"Curve and surface fitting","author":"Lancaster","year":"1986","journal-title":"An introduction[M]. DBLP"}],"event":{"name":"2023 18th International Conference on Intelligent Systems and Knowledge Engineering (ISKE)","start":{"date-parts":[[2023,11,17]]},"location":"Fuzhou, China","end":{"date-parts":[[2023,11,19]]}},"container-title":["2023 18th International Conference on Intelligent Systems and Knowledge Engineering (ISKE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10480909\/10480924\/10480941.pdf?arnumber=10480941","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,4,9]],"date-time":"2024-04-09T05:09:14Z","timestamp":1712639354000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10480941\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,11,17]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/iske60036.2023.10480941","relation":{},"subject":[],"published":{"date-parts":[[2023,11,17]]}}}