{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,7]],"date-time":"2026-04-07T20:58:38Z","timestamp":1775595518341,"version":"3.50.1"},"reference-count":6,"publisher":"IEEE","license":[{"start":{"date-parts":[[2011,11,1]],"date-time":"2011-11-01T00:00:00Z","timestamp":1320105600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2011,11,1]],"date-time":"2011-11-01T00:00:00Z","timestamp":1320105600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,11]]},"DOI":"10.1109\/isocc.2011.6138773","type":"proceedings-article","created":{"date-parts":[[2012,1,31]],"date-time":"2012-01-31T16:36:42Z","timestamp":1328027802000},"page":"313-316","source":"Crossref","is-referenced-by-count":0,"title":["Performance-effective compaction of standard cell library for edge-triggered latches utilizing 0.5 micron technology"],"prefix":"10.1109","author":[{"given":"Chun","family":"Zhao","sequence":"first","affiliation":[{"name":"Department of EEE, University of Liverpool, Liverpool, United Kingdom"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"W.","family":"Pan","sequence":"additional","affiliation":[{"name":"Department of EEE, Xi'an Jiaotong - Liverpool University, Suzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C. Z.","family":"Zhao","sequence":"additional","affiliation":[{"name":"Department of EEE, University of Liverpool, Liverpool, United Kingdom"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K. L.","family":"Man","sequence":"additional","affiliation":[{"name":"Department of CS, Xi'an Jiaotong - Liverpool University, Suzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Choi","sequence":"additional","affiliation":[{"name":"University of Seoul, Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Chang","sequence":"additional","affiliation":[{"name":"Texas Instruments, United States"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ARTCom.2009.132"},{"key":"ref3","first-page":"858","article-title":"The Solving Method of Simulating and Optimizing the Unified Multidisciplinary Constraint Model","volume":"2","author":"chen","year":"2010","journal-title":"2010 International Conference on Intelligent System Design and Engineering Application"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCS.2007.4292676"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/SOCC.2006.283854"},{"key":"ref2","first-page":"179","article-title":"On-Chip Measurements of Standard-Cell Propagation Delay","author":"churayev","year":"2011","journal-title":"Design & Test Symposium (EWDTS)"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IPDI.1998.663624"}],"event":{"name":"2011 International SoC Design Conference (ISOCC 2011)","location":"Jeju, Korea (South)","start":{"date-parts":[[2011,11,17]]},"end":{"date-parts":[[2011,11,18]]}},"container-title":["2011 International SoC Design Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6126155\/6138611\/06138773.pdf?arnumber=6138773","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,4,7]],"date-time":"2026-04-07T19:57:59Z","timestamp":1775591879000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6138773\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,11]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/isocc.2011.6138773","relation":{},"subject":[],"published":{"date-parts":[[2011,11]]}}}