{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T22:56:03Z","timestamp":1725404163678},"reference-count":4,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,10]]},"DOI":"10.1109\/isocc.2016.7799762","type":"proceedings-article","created":{"date-parts":[[2016,12,29]],"date-time":"2016-12-29T21:50:06Z","timestamp":1483048206000},"page":"39-40","source":"Crossref","is-referenced-by-count":0,"title":["Software-based embedded core test using multi-polynomial for test data reduction"],"prefix":"10.1109","author":[{"given":"Soyeon","family":"Kang","sequence":"first","affiliation":[]},{"given":"Inhyuk","family":"Choi","sequence":"additional","affiliation":[]},{"given":"Hyeonchan","family":"Lim","sequence":"additional","affiliation":[]},{"given":"Sungyoul","family":"Seo","sequence":"additional","affiliation":[]},{"given":"Sungho","family":"Kang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2005.1465254"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2011.2162173"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1023\/A:1027422805851"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ETSYM.2010.5512758"}],"event":{"name":"2016 International SoC Design Conference (ISOCC)","start":{"date-parts":[[2016,10,23]]},"location":"Jeju, South Korea","end":{"date-parts":[[2016,10,26]]}},"container-title":["2016 International SoC Design Conference (ISOCC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7787093\/7799693\/07799762.pdf?arnumber=7799762","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,1,20]],"date-time":"2017-01-20T12:09:52Z","timestamp":1484914192000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7799762\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,10]]},"references-count":4,"URL":"https:\/\/doi.org\/10.1109\/isocc.2016.7799762","relation":{},"subject":[],"published":{"date-parts":[[2016,10]]}}}