{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,21]],"date-time":"2025-08-21T16:13:46Z","timestamp":1755792826878,"version":"3.44.0"},"reference-count":5,"publisher":"IEEE","license":[{"start":{"date-parts":[[2016,10,1]],"date-time":"2016-10-01T00:00:00Z","timestamp":1475280000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2016,10,1]],"date-time":"2016-10-01T00:00:00Z","timestamp":1475280000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,10]]},"DOI":"10.1109\/isocc.2016.7799829","type":"proceedings-article","created":{"date-parts":[[2016,12,29]],"date-time":"2016-12-29T16:50:06Z","timestamp":1483030206000},"page":"145-146","source":"Crossref","is-referenced-by-count":1,"title":["eFuse based IC authentication architecture"],"prefix":"10.1109","author":[{"given":"Seung-Yeob","family":"Lee","sequence":"first","affiliation":[{"name":"Department of Semiconductor and Display Engineering, Sungkyunkwan University, Suwon, Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Joon-Sung","family":"Yang","sequence":"additional","affiliation":[{"name":"Department of Semiconductor and Display Engineering, Sungkyunkwan University, Suwon, Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"crossref","first-page":"106","DOI":"10.1007\/978-3-319-04852-9_6","article-title":"Attacking PUF-based pattern matching key generators via helper data manipulation.","author":"delvaux","year":"2014","journal-title":"Topics in CryptologyCT-RSA 2014"},{"key":"ref3","article-title":"Quo vadis, PUF?: trends and challenges of emerging physical-disorder based security","author":"masoud","year":"2014","journal-title":"Proc Design Automation & Test Europe Conf"},{"key":"ref5","article-title":"Electrically programmable fuse (eFUSE): from memory redundancy to autonomic chips","author":"norman","year":"2007","journal-title":"2007 IEEE Custom Integrated Circuits Conference"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2320516"},{"key":"ref1","first-page":"9","article-title":"Physical unclonable functions for device authentication and secret key generation","author":"edward","year":"2007","journal-title":"ACM\/IEEE Design Automation Conference (DAC)"}],"event":{"name":"2016 International SoC Design Conference (ISOCC)","start":{"date-parts":[[2016,10,23]]},"location":"Jeju, Korea (South)","end":{"date-parts":[[2016,10,26]]}},"container-title":["2016 International SoC Design Conference (ISOCC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7787093\/7799693\/07799829.pdf?arnumber=7799829","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,14]],"date-time":"2025-08-14T18:41:22Z","timestamp":1755196882000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/7799829\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,10]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/isocc.2016.7799829","relation":{},"subject":[],"published":{"date-parts":[[2016,10]]}}}