{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T17:33:26Z","timestamp":1725557606969},"reference-count":3,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,10]]},"DOI":"10.1109\/isocc.2016.7799831","type":"proceedings-article","created":{"date-parts":[[2016,12,29]],"date-time":"2016-12-29T21:50:06Z","timestamp":1483048206000},"page":"149-150","source":"Crossref","is-referenced-by-count":0,"title":["A test methodology to screen scan-path failures"],"prefix":"10.1109","author":[{"given":"Junghwan","family":"Kim","sequence":"first","affiliation":[]},{"given":"Young-woo","family":"Lee","sequence":"additional","affiliation":[]},{"given":"Minho","family":"Cheong","sequence":"additional","affiliation":[]},{"given":"Sungyoul","family":"Seo","sequence":"additional","affiliation":[]},{"given":"Sungho","family":"Kang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref3","first-page":"1","article-title":"Acheving serendiptous N-detect mark-offs in Multi-Capture-Clock scan patterns","author":"bhargava","year":"2007","journal-title":"Proc International Test Conference"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DTIS.2014.6850663"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2008.83"}],"event":{"name":"2016 International SoC Design Conference (ISOCC)","start":{"date-parts":[[2016,10,23]]},"location":"Jeju, South Korea","end":{"date-parts":[[2016,10,26]]}},"container-title":["2016 International SoC Design Conference (ISOCC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7787093\/7799693\/07799831.pdf?arnumber=7799831","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,1,20]],"date-time":"2017-01-20T11:58:31Z","timestamp":1484913511000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7799831\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,10]]},"references-count":3,"URL":"https:\/\/doi.org\/10.1109\/isocc.2016.7799831","relation":{},"subject":[],"published":{"date-parts":[[2016,10]]}}}