{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T03:41:48Z","timestamp":1725594108817},"reference-count":4,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,10,6]],"date-time":"2019-10-06T00:00:00Z","timestamp":1570320000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,10,6]],"date-time":"2019-10-06T00:00:00Z","timestamp":1570320000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,10,6]],"date-time":"2019-10-06T00:00:00Z","timestamp":1570320000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,10,6]]},"DOI":"10.1109\/isocc47750.2019.9027754","type":"proceedings-article","created":{"date-parts":[[2020,3,10]],"date-time":"2020-03-10T02:18:55Z","timestamp":1583806735000},"page":"231-232","source":"Crossref","is-referenced-by-count":1,"title":["Peak Variation Detection Using Variable Length Moving Average Filter for Defects Inspection Systems"],"prefix":"10.1109","author":[{"given":"Ho-Yun","family":"Lee","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yeon-Jin","family":"Kim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Do-Yeon","family":"Hwang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jin-Gyun","family":"Chung","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2011.2157492"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1080\/10589759208952989"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/20.123964"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/20.43887"}],"event":{"name":"2019 International SoC Design Conference (ISOCC)","start":{"date-parts":[[2019,10,6]]},"location":"Jeju, Korea (South)","end":{"date-parts":[[2019,10,9]]}},"container-title":["2019 International SoC Design Conference (ISOCC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9017212\/9027628\/09027754.pdf?arnumber=9027754","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,17]],"date-time":"2022-07-17T17:48:22Z","timestamp":1658080102000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9027754\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,10,6]]},"references-count":4,"URL":"https:\/\/doi.org\/10.1109\/isocc47750.2019.9027754","relation":{},"subject":[],"published":{"date-parts":[[2019,10,6]]}}}