{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:13:04Z","timestamp":1740100384150,"version":"3.37.3"},"reference-count":7,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,10,6]],"date-time":"2021-10-06T00:00:00Z","timestamp":1633478400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,10,6]],"date-time":"2021-10-06T00:00:00Z","timestamp":1633478400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,10,6]],"date-time":"2021-10-06T00:00:00Z","timestamp":1633478400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100004608","name":"Natural Science Foundation of Jiangsu Province","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004608","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,10,6]]},"DOI":"10.1109\/isocc53507.2021.9613949","type":"proceedings-article","created":{"date-parts":[[2021,11,25]],"date-time":"2021-11-25T20:31:55Z","timestamp":1637872315000},"page":"268-269","source":"Crossref","is-referenced-by-count":1,"title":["Detecting LED Chip Surface Defects with Modified Faster R-CNN"],"prefix":"10.1109","author":[{"given":"Zhiwen","family":"Zhang","sequence":"first","affiliation":[]},{"given":"Qian","family":"Gong","sequence":"additional","affiliation":[]},{"given":"Yuan","family":"Cao","sequence":"additional","affiliation":[]},{"given":"Cheng","family":"Yin","sequence":"additional","affiliation":[]},{"given":"Enyi","family":"Yao","sequence":"additional","affiliation":[]},{"given":"Yanhua","family":"Liu","sequence":"additional","affiliation":[]},{"given":"Yongqing","family":"Pan","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2016.2577031"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2915404"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.106"},{"journal-title":"open-mmlab\/mmdetection","year":"2021","key":"ref7"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"779","DOI":"10.1109\/CVPR.2016.91","article-title":"You Only Look Once: Unified, Real-Time Object Detection","author":"redmon","year":"2016","journal-title":"2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-017-0882-0"}],"event":{"name":"2021 18th International SoC Design Conference (ISOCC)","start":{"date-parts":[[2021,10,6]]},"location":"Jeju Island, Korea, Republic of","end":{"date-parts":[[2021,10,9]]}},"container-title":["2021 18th International SoC Design Conference (ISOCC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9613844\/9613845\/09613949.pdf?arnumber=9613949","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T16:52:36Z","timestamp":1652201556000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9613949\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,10,6]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/isocc53507.2021.9613949","relation":{},"subject":[],"published":{"date-parts":[[2021,10,6]]}}}