{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,20]],"date-time":"2026-07-20T19:13:04Z","timestamp":1784574784889,"version":"3.55.0"},"reference-count":5,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,10,19]],"date-time":"2022-10-19T00:00:00Z","timestamp":1666137600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,10,19]],"date-time":"2022-10-19T00:00:00Z","timestamp":1666137600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,10,19]]},"DOI":"10.1109\/isocc56007.2022.10031357","type":"proceedings-article","created":{"date-parts":[[2023,2,7]],"date-time":"2023-02-07T14:12:27Z","timestamp":1675779147000},"page":"53-54","source":"Crossref","is-referenced-by-count":4,"title":["Correlation Aware Random Pattern Generation for Test Time and Shift Power Reduction of Logic BIST"],"prefix":"10.1109","author":[{"given":"Jongho","family":"Park","sequence":"first","affiliation":[{"name":"Yonsei University,Dept. of Electrical and Electronic Engineering,Seoul,Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Sangjun","family":"Lee","sequence":"additional","affiliation":[{"name":"Yonsei University,Dept. of Electrical and Electronic Engineering,Seoul,Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Inhwan","family":"Lee","sequence":"additional","affiliation":[{"name":"Yonsei University,Dept. of Electrical and Electronic Engineering,Seoul,Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Sungwhan","family":"Park","sequence":"additional","affiliation":[{"name":"Yonsei University,Dept. of Electrical and Electronic Engineering,Seoul,Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Sungho","family":"Kang","sequence":"additional","affiliation":[{"name":"Yonsei University,Dept. of Electrical and Electronic Engineering,Seoul,Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3105429"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2016.2617160"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843824"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2016.2606248"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2001.923409"}],"event":{"name":"2022 19th International SoC Design Conference (ISOCC)","location":"Gangneung-si, Korea, Republic of","start":{"date-parts":[[2022,10,19]]},"end":{"date-parts":[[2022,10,22]]}},"container-title":["2022 19th International SoC Design Conference (ISOCC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10031262\/10031265\/10031357.pdf?arnumber=10031357","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,2,28]],"date-time":"2023-02-28T13:31:02Z","timestamp":1677591062000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10031357\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,10,19]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/isocc56007.2022.10031357","relation":{},"subject":[],"published":{"date-parts":[[2022,10,19]]}}}