{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T23:08:05Z","timestamp":1747868885843,"version":"3.28.0"},"reference-count":21,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/isqed.2003.1194733","type":"proceedings-article","created":{"date-parts":[[2004,3,22]],"date-time":"2004-03-22T14:34:28Z","timestamp":1079966068000},"page":"208-213","source":"Crossref","is-referenced-by-count":0,"title":["Impact of interoperability on CAD-IP reuse: an academic viewpoint"],"prefix":"10.1109","author":[{"given":"A.B.","family":"Kahng","sequence":"first","affiliation":[]},{"given":"I.L.","family":"Markov","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"year":"1999","key":"ref10"},{"key":"ref11","first-page":"171","article-title":"Interconnect Characteristics of 2.5-D System Integration Scheme","author":"deng","year":"2002","journal-title":"Proc Intl Symp on Physical Design"},{"key":"ref12","doi-asserted-by":"crossref","first-page":"194","DOI":"10.1109\/DATE.2000.840038","article-title":"Transformational Placement and Synthesis","author":"donath","year":"2000","journal-title":"Proc Design Automation and Test in Europe (DATE)"},{"year":"0","key":"ref13"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/774572.774681"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/369691.369727"},{"year":"0","key":"ref16"},{"year":"0","key":"ref17"},{"article-title":"The Open Source Software Licensing Page","year":"1998","author":"rosenberg","key":"ref18"},{"article-title":"The Stony Brook Algorithm Repository","year":"1997","author":"skiena","key":"ref19"},{"key":"ref4","first-page":"87","article-title":"ACM\/SIGDA Design Automation Benchmarks: Catalyst or Anathema?","volume":"10","author":"brglez","year":"1993","journal-title":"IEEE Design and Test"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/BF02430363"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/309847.309955"},{"key":"ref5","article-title":"Design of Experiments to Evaluate CAD Algorithms: Which Improvements Are Due to Improved Heuristic and Which are Merely Due to Chance?","author":"brglez","year":"1998","journal-title":"Technical report CBL-04-Brglez"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/337292.337549"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/351827.384247"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/505388.505392"},{"year":"0","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2002.1003801"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/505388.505400"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/378239.379064"}],"event":{"name":"ISQED 2003: 4th International Symposium on Quality Electronic Design","acronym":"ISQED-03","location":"San Jose, CA, USA"},"container-title":["Fourth International Symposium on Quality Electronic Design, 2003. Proceedings."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8500\/26872\/01194733.pdf?arnumber=1194733","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,4,25]],"date-time":"2018-04-25T01:53:17Z","timestamp":1524621197000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1194733\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/isqed.2003.1194733","relation":{},"subject":[]}}