{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T05:16:17Z","timestamp":1725426977947},"reference-count":13,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/isqed.2004.1283654","type":"proceedings-article","created":{"date-parts":[[2004,5,6]],"date-time":"2004-05-06T20:18:03Z","timestamp":1083874683000},"page":"81-85","source":"Crossref","is-referenced-by-count":2,"title":["New test access for high resolution \u03a3\u0394 ADCs by using the noise transfer function evaluation"],"prefix":"10.1109","author":[{"given":"D.","family":"De Venuto","sequence":"first","affiliation":[]}],"member":"263","reference":[{"journal-title":"SMASH User Manual 2003","year":"0","key":"13"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TCOM.1985.1096276"},{"journal-title":"IEEE Standard for Digitizing Waveform Recorders","year":"0","key":"12"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1993.470621"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.1994.331906"},{"key":"1","first-page":"307","article-title":"Hybrid built in self-test (HBIST) for mixed analogue\/digital ICs","author":"ohletz","year":"1991","journal-title":"2nd European Test Conference ETC91"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/9780470545461"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639641"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2001.915083"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639689"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1993.470623"},{"key":"9","first-page":"239","article-title":"A multifunctional test structure for analog BIST","author":"lubaszewski","year":"1996","journal-title":"IEEE Int Mixed Signal Testing Workshop"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041859"}],"event":{"name":"5th International Symposium on Quality Electronic Design","acronym":"ISQED-04","location":"San Jose, CA, USA"},"container-title":["SCS 2003. International Symposium on Signals, Circuits and Systems. Proceedings (Cat. No.03EX720)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9029\/28654\/01283654.pdf?arnumber=1283654","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T21:52:50Z","timestamp":1489441970000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1283654\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/isqed.2004.1283654","relation":{},"subject":[]}}