{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T07:35:42Z","timestamp":1725521742170},"reference-count":9,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/isqed.2004.1283663","type":"proceedings-article","created":{"date-parts":[[2004,5,6]],"date-time":"2004-05-06T16:18:03Z","timestamp":1083860283000},"page":"131-136","source":"Crossref","is-referenced-by-count":2,"title":["Analysis and reduction of on-chip inductance effects in power supply grids"],"prefix":"10.1109","author":[{"family":"Woo Hyung Lee","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Pant","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.","family":"Blaauw","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"crossref","first-page":"744","DOI":"10.1145\/277044.277231","article-title":"Full-chip verification methods for DSM power distribution systems","author":"steele","year":"1998","journal-title":"Proceedings 1998 Design and Automation Conference 35th DAC (Cat No 98CH36175) DAC"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1997.597223"},{"key":"1","doi-asserted-by":"crossref","first-page":"179","DOI":"10.1109\/LPE.2000.155274","article-title":"model and analysis for combined package and on-chip power grid simulation","author":"panda","year":"2000","journal-title":"ISLPED 00 the 2000 International Symposium on Low Power Electronics and Design (Cat No 00TH8514) LPE-00"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/66.827347"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/ECTC.1990.122212"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1147\/rd.165.0470"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1145\/277044.277229"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2001.935530"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.6028\/jres.069C.016"}],"event":{"name":"5th International Symposium on Quality Electronic Design","acronym":"ISQED-04","location":"San Jose, CA, USA"},"container-title":["SCS 2003. International Symposium on Signals, Circuits and Systems. Proceedings (Cat. No.03EX720)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9029\/28654\/01283663.pdf?arnumber=1283663","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,16]],"date-time":"2017-06-16T02:52:36Z","timestamp":1497581556000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1283663\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/isqed.2004.1283663","relation":{},"subject":[]}}