{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,7]],"date-time":"2026-05-07T16:29:33Z","timestamp":1778171373647,"version":"3.51.4"},"reference-count":13,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/isqed.2004.1283699","type":"proceedings-article","created":{"date-parts":[[2004,5,6]],"date-time":"2004-05-06T20:18:03Z","timestamp":1083874683000},"page":"351-356","source":"Crossref","is-referenced-by-count":6,"title":["Application specific worst case corners using response surfaces and statistical models"],"prefix":"10.1109","author":[{"given":"M.","family":"Sengupta","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Saxena","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"L.","family":"Daldoss","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G.","family":"Kramer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Minehane","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Jianjun Cheng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"13","doi-asserted-by":"crossref","DOI":"10.1007\/978-0-387-21706-2","author":"venebles","year":"2002","journal-title":"Modern Applied Statistics with S"},{"key":"11","author":"box","year":"1987","journal-title":"Empirical Model-Building and Response Surfaces"},{"key":"12","author":"press","year":"1999","journal-title":"Numerical Recipes in C"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/66.85939"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/43.372370"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/66.806116"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1990.112346"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.1995.518176"},{"key":"6","first-page":"702","article-title":"An assigned probability technique to derive realistic worst case timing models of digital standard cells","author":"dal fabbro","year":"1995","journal-title":"Proc IEEE Design Automation Conf"},{"key":"5","doi-asserted-by":"crossref","first-page":"104","DOI":"10.1109\/TCAD.1986.1270181","article-title":"A methodology for worst-case analysis of integrated circuits","volume":"cad 5","author":"nassif","year":"1986","journal-title":"IEEE Trans Computer-Aided Design"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/66.806125"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1049\/ip-i-1.1987.0025"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.1995.518206"}],"event":{"name":"5th International Symposium on Quality Electronic Design","location":"San Jose, CA, USA","acronym":"ISQED-04"},"container-title":["SCS 2003. International Symposium on Signals, Circuits and Systems. Proceedings (Cat. No.03EX720)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9029\/28654\/01283699.pdf?arnumber=1283699","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,16]],"date-time":"2017-06-16T06:52:37Z","timestamp":1497595957000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1283699\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/isqed.2004.1283699","relation":{},"subject":[]}}