{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T20:36:46Z","timestamp":1729629406441,"version":"3.28.0"},"reference-count":8,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/isqed.2004.1283714","type":"proceedings-article","created":{"date-parts":[[2004,5,6]],"date-time":"2004-05-06T20:18:03Z","timestamp":1083874683000},"page":"445-450","source":"Crossref","is-referenced-by-count":0,"title":["Design to avoid the over-gate-driven effect on ESD protection circuits in deep-submicron CMOS processes"],"prefix":"10.1109","author":[{"family":"Ming-Dou Ker","sequence":"first","affiliation":[]},{"family":"Wen-Yi Chen","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"131","article-title":"Achieving uniform NMOS device power distribution for submicron ESD reliability","author":"duvvury","year":"1992","journal-title":"Tech Dig IEDM"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.1996.492125"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/16.735721"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"307","DOI":"10.1109\/92.532032","article-title":"Capacitor-couple ESD protection circuit for deep-submicron low-voltage CMOS ASIC","volume":"4","author":"ker","year":"1996","journal-title":"IEEE Trans VLSI Syst"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/7298.995833"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2003.815200"},{"journal-title":"ESD Test Standard","year":"1998","key":"ref2"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/0470846054"}],"event":{"name":"5th International Symposium on Quality Electronic Design","acronym":"ISQED-04","location":"San Jose, CA, USA"},"container-title":["SCS 2003. International Symposium on Signals, Circuits and Systems. Proceedings (Cat. No.03EX720)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9029\/28654\/01283714.pdf?arnumber=1283714","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,16]],"date-time":"2017-06-16T06:52:37Z","timestamp":1497595957000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1283714\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/isqed.2004.1283714","relation":{},"subject":[]}}