{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T21:32:16Z","timestamp":1762032736882,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,3]]},"DOI":"10.1109\/isqed.2008.4479719","type":"proceedings-article","created":{"date-parts":[[2008,4,2]],"date-time":"2008-04-02T18:55:10Z","timestamp":1207162510000},"page":"162-167","source":"Crossref","is-referenced-by-count":6,"title":["Variation Aware Spline Center and Range Modeling for Analog Circuit Performance"],"prefix":"10.1109","author":[{"given":"Shubhankar","family":"Basu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Balaji","family":"Kommineni","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ranga","family":"Vemuri","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"3","DOI":"10.1109\/CDC.1998.758672"},{"year":"0","key":"2"},{"key":"10","article-title":"asymptotic probability extraction for non-normal distribution of circuit","author":"li","year":"2004","journal-title":"IEEE ICCAD"},{"doi-asserted-by":"publisher","key":"1","DOI":"10.1109\/ICCAD.2005.1560106"},{"year":"0","key":"7"},{"doi-asserted-by":"publisher","key":"6","DOI":"10.1109\/SBRN.2006.27"},{"year":"1977","author":"duchon","journal-title":"Constructive Theory of Functions of Several Variables Lecture Notes in Mathematics","key":"5"},{"key":"4","article-title":"adaptive sampling and modeling of analog circuit performance parameters with pseudo-cubic splines","volume":"931 938","author":"wolfe","year":"2004","journal-title":"IEEE ICCAD"},{"year":"1966","author":"moore","journal-title":"Interval Analysis","key":"9"},{"doi-asserted-by":"publisher","key":"8","DOI":"10.1007\/BF00713977"},{"year":"0","key":"11"},{"doi-asserted-by":"publisher","key":"12","DOI":"10.1109\/ISQED.2007.136"}],"event":{"name":"2008 9th International Symposium of Quality of Electronic Design (ISQED)","start":{"date-parts":[[2008,3,17]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2008,3,19]]}},"container-title":["9th International Symposium on Quality Electronic Design (isqed 2008)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4479672\/4479673\/04479719.pdf?arnumber=4479719","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T22:17:07Z","timestamp":1489702627000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4479719\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,3]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/isqed.2008.4479719","relation":{},"subject":[],"published":{"date-parts":[[2008,3]]}}}