{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T12:03:24Z","timestamp":1725537804112},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,3]]},"DOI":"10.1109\/isqed.2008.4479749","type":"proceedings-article","created":{"date-parts":[[2008,4,2]],"date-time":"2008-04-02T18:55:10Z","timestamp":1207162510000},"page":"325-329","source":"Crossref","is-referenced-by-count":3,"title":["Process Variability Analysis in DSM Through Statistical Simulations and its Implications to Design Methodologies"],"prefix":"10.1109","author":[{"given":"Srinivasa R","family":"STG","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jandhyala","family":"Srivatsava","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Narahari Tondamuthuru","family":"R","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1145\/775832.775920"},{"year":"0","key":"2"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/40.782564"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/ASIC.2002.1158094"},{"key":"5","first-page":"451","author":"nassif design","year":"2000","journal-title":"IEEE Internation Symposium on Quality Electronic Design"},{"key":"4","article-title":"demystify variation-aware design","author":"scemanenco","year":"2007","journal-title":"SNUG San Jose"}],"event":{"name":"2008 9th International Symposium of Quality of Electronic Design (ISQED)","start":{"date-parts":[[2008,3,17]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2008,3,19]]}},"container-title":["9th International Symposium on Quality Electronic Design (isqed 2008)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4479672\/4479673\/04479749.pdf?arnumber=4479749","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T19:03:23Z","timestamp":1489691003000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4479749\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,3]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/isqed.2008.4479749","relation":{},"subject":[],"published":{"date-parts":[[2008,3]]}}}