{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,23]],"date-time":"2025-08-23T00:40:01Z","timestamp":1755909601356,"version":"3.44.0"},"reference-count":7,"publisher":"IEEE","license":[{"start":{"date-parts":[[2008,3,1]],"date-time":"2008-03-01T00:00:00Z","timestamp":1204329600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2008,3,1]],"date-time":"2008-03-01T00:00:00Z","timestamp":1204329600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,3]]},"DOI":"10.1109\/isqed.2008.4479751","type":"proceedings-article","created":{"date-parts":[[2008,4,2]],"date-time":"2008-04-02T14:55:10Z","timestamp":1207148110000},"page":"334-337","source":"Crossref","is-referenced-by-count":4,"title":["Evaluation of the PTSI Crosstalk Noise Analysis Tool and Development of an Automated Spice Correlation Suite to Enable Accuracy Validation"],"prefix":"10.1109","author":[{"given":"C.R.","family":"Venugopal","sequence":"first","affiliation":[{"name":"SJCE, Mysore"}]},{"given":"Prasanth","family":"Soraiyur","sequence":"additional","affiliation":[]},{"given":"Jagannath","family":"Rao","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"year":"0","key":"3"},{"year":"0","key":"2"},{"year":"0","key":"1"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.831568"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.2004.1261009"},{"key":"5","article-title":"dynamic noise margin: definitions and model","author":"ding","year":"0","journal-title":"Proc 17th Int Conf VLSI Design (VLSID'04)"},{"year":"0","key":"4"}],"event":{"name":"2008 9th International Symposium of Quality of Electronic Design (ISQED)","start":{"date-parts":[[2008,3,17]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2008,3,19]]}},"container-title":["9th International Symposium on Quality Electronic Design (isqed 2008)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4479672\/4479673\/04479751.pdf?arnumber=4479751","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,23]],"date-time":"2025-08-23T00:01:22Z","timestamp":1755907282000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/4479751\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,3]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/isqed.2008.4479751","relation":{},"subject":[],"published":{"date-parts":[[2008,3]]}}}