{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T08:15:20Z","timestamp":1730276120508,"version":"3.28.0"},"reference-count":2,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,3]]},"DOI":"10.1109\/isqed.2008.4479773","type":"proceedings-article","created":{"date-parts":[[2008,4,2]],"date-time":"2008-04-02T14:55:10Z","timestamp":1207148110000},"page":"441-444","source":"Crossref","is-referenced-by-count":1,"title":["XStatic: A Simulation Based ESD Verification and Debug Environment"],"prefix":"10.1109","author":[{"given":"Ganesh R.","family":"Shamnur","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rajesh R.","family":"Berigei","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Chip Level ESD Simulation for Fail Detection and Design Guidance","year":"0","author":"driien","key":"2"},{"key":"1","first-page":"104","volume":"eos 20","author":"puvvada","year":"1998","journal-title":"A Simulation Study of HBM Failure in an Internal Clock Buffer and the Design Issues for Efficient Power Pin Protection Strategy"}],"event":{"name":"2008 9th International Symposium of Quality of Electronic Design (ISQED)","start":{"date-parts":[[2008,3,17]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2008,3,19]]}},"container-title":["9th International Symposium on Quality Electronic Design (isqed 2008)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4479672\/4479673\/04479773.pdf?arnumber=4479773","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T18:01:27Z","timestamp":1489687287000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4479773\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,3]]},"references-count":2,"URL":"https:\/\/doi.org\/10.1109\/isqed.2008.4479773","relation":{},"subject":[],"published":{"date-parts":[[2008,3]]}}}