{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T20:18:16Z","timestamp":1725567496295},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,3]]},"DOI":"10.1109\/isqed.2008.4479774","type":"proceedings-article","created":{"date-parts":[[2008,4,2]],"date-time":"2008-04-02T14:55:10Z","timestamp":1207148110000},"page":"445-449","source":"Crossref","is-referenced-by-count":1,"title":["Statistical Crosstalk Noise Analysis Using First Order Parameterized Approach for Aggressor Grouping"],"prefix":"10.1109","author":[{"given":"Sachin","family":"Shrivastava","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Harindranath","family":"Parameswaran","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2002.1012706"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2005.1466215"},{"key":"1","doi-asserted-by":"crossref","first-page":"139","DOI":"10.1109\/ICCAD.1997.643396","article-title":"global harmony: coupled noise analysis for full-chip rc interconnect analysis","author":"shepherd","year":"1997","journal-title":"Proc Intl Conf Computer-Aided Design"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1287\/opre.9.2.145"},{"key":"6","article-title":"explicit computation of performance as a function of process variation","author":"lou","year":"2002","journal-title":"Proc TAU"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2007.92"},{"key":"4","first-page":"331","article-title":"First-order incremental block-based statistical timing analysis","author":"visweswariah","year":"2004","journal-title":"Proceedings 41st Design Automation Conference 2004 DAC"},{"key":"8","article-title":"multivariate statistical methods","author":"morrison","year":"1976","journal-title":"New York"}],"event":{"name":"2008 9th International Symposium of Quality of Electronic Design (ISQED)","start":{"date-parts":[[2008,3,17]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2008,3,19]]}},"container-title":["9th International Symposium on Quality Electronic Design (isqed 2008)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4479672\/4479673\/04479774.pdf?arnumber=4479774","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,9]],"date-time":"2019-05-09T16:32:53Z","timestamp":1557419573000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4479774\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,3]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/isqed.2008.4479774","relation":{},"subject":[],"published":{"date-parts":[[2008,3]]}}}