{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T06:11:38Z","timestamp":1747807898442},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,3]]},"DOI":"10.1109\/isqed.2008.4479799","type":"proceedings-article","created":{"date-parts":[[2008,4,2]],"date-time":"2008-04-02T18:55:10Z","timestamp":1207162510000},"page":"572-577","source":"Crossref","is-referenced-by-count":6,"title":["A Tunable Clock Buffer for Intra-die PVT Compensation in Single-Edge Clock (SEC) Distribution Networks"],"prefix":"10.1109","author":[{"given":"Jeff","family":"Mueller","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Resve","family":"Saleh","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.2004.1399754"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2005.1560135"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.859894"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.855928"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2002.1186901"},{"key":"6","first-page":"611","article-title":"a yield improvement methodology using pre- and post-silicon statistical clock scheduling","author":"tsai","year":"2004","journal-title":"IEEE"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2003.159783"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2005.114"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.1987.1270271"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI.2008.36"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.857370"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/SSMSD.2001.914938"}],"event":{"name":"2008 9th International Symposium of Quality of Electronic Design (ISQED)","start":{"date-parts":[[2008,3,17]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2008,3,19]]}},"container-title":["9th International Symposium on Quality Electronic Design (isqed 2008)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4479672\/4479673\/04479799.pdf?arnumber=4479799","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T22:05:19Z","timestamp":1489701919000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4479799\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,3]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/isqed.2008.4479799","relation":{},"subject":[],"published":{"date-parts":[[2008,3]]}}}