{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T19:28:58Z","timestamp":1725391738970},"reference-count":0,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,3]]},"DOI":"10.1109\/isqed.2008.4479800","type":"proceedings-article","created":{"date-parts":[[2008,4,2]],"date-time":"2008-04-02T18:55:10Z","timestamp":1207162510000},"page":"585-585","source":"Crossref","is-referenced-by-count":0,"title":["Plenary Speech 2P1: Consumerization of Electronics and Nanometer Technologies: Implications for Manufacturing Test"],"prefix":"10.1109","author":[{"given":"Sanjiv","family":"Taneja","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","event":{"name":"2008 9th International Symposium of Quality of Electronic Design (ISQED)","start":{"date-parts":[[2008,3,17]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2008,3,19]]}},"container-title":["9th International Symposium on Quality Electronic Design (isqed 2008)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4479672\/4479673\/04479800.pdf?arnumber=4479800","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T21:50:22Z","timestamp":1489701022000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4479800\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,3]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/isqed.2008.4479800","relation":{},"subject":[],"published":{"date-parts":[[2008,3]]}}}