{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T10:19:43Z","timestamp":1725617983074},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,3]]},"DOI":"10.1109\/isqed.2008.4479829","type":"proceedings-article","created":{"date-parts":[[2008,4,2]],"date-time":"2008-04-02T18:55:10Z","timestamp":1207162510000},"page":"734-737","source":"Crossref","is-referenced-by-count":8,"title":["A Design Model for Random Process Variability"],"prefix":"10.1109","author":[{"given":"Victoria","family":"Wang","sequence":"first","affiliation":[]},{"given":"Kanak","family":"Agarwal","sequence":"additional","affiliation":[]},{"given":"Sani","family":"Nassif","sequence":"additional","affiliation":[]},{"given":"Kevin","family":"Nowka","sequence":"additional","affiliation":[]},{"given":"Dejan","family":"Markovic","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2006.1705315"},{"journal-title":"Ring Oscillator Based Technique for Measuring Variability Statistics ICMTS","year":"2006","author":"bhushan","key":"2"},{"journal-title":"Design for Variability in DSM Technologies ISQED","year":"2000","author":"nassif","key":"10"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2006.1705316"},{"journal-title":"Matching Properties of Deep Sub-Micron MOS Transistors","year":"2005","author":"croon","key":"7"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1989.572629"},{"journal-title":"Variation ISQED","year":"2007","author":"boning","key":"5"},{"journal-title":"The EPFL-EKV Mosfet Model Equations for Simulation","year":"1999","author":"bucher","key":"4"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/4.127338"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/4.52187"},{"journal-title":"Contemporary Problems in Statistics","year":"1971","author":"lieberman","key":"11"}],"event":{"name":"2008 9th International Symposium of Quality of Electronic Design (ISQED)","start":{"date-parts":[[2008,3,17]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2008,3,19]]}},"container-title":["9th International Symposium on Quality Electronic Design (isqed 2008)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4479672\/4479673\/04479829.pdf?arnumber=4479829","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T19:00:15Z","timestamp":1489690815000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4479829\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,3]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/isqed.2008.4479829","relation":{},"subject":[],"published":{"date-parts":[[2008,3]]}}}