{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T18:29:24Z","timestamp":1729621764813,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,3]]},"DOI":"10.1109\/isqed.2008.4479843","type":"proceedings-article","created":{"date-parts":[[2008,4,2]],"date-time":"2008-04-02T18:55:10Z","timestamp":1207162510000},"page":"815-820","source":"Crossref","is-referenced-by-count":11,"title":["On-Chip Process Variation Detection and Compensation Using Delay and Slew-Rate Monitoring Circuits"],"prefix":"10.1109","author":[{"given":"Amlan","family":"Ghosh","sequence":"first","affiliation":[]},{"given":"Rahul M.","family":"Rao","sequence":"additional","affiliation":[]},{"given":"Ching-Te","family":"Chuang","sequence":"additional","affiliation":[]},{"given":"Richard B.","family":"Brown","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","first-page":"5246","volume":"5","author":"zhou","year":"2005","journal-title":"Measurement of delay mismatch due to process variations by means of modified ring oscillators"},{"key":"2"},{"key":"10","article-title":"parametric yield analysis and constrained-based supply voltage optimization","author":"rao","year":"2005","journal-title":"Proc ISQED"},{"key":"1","first-page":"1396","article-title":"adaptive body bias for reducing impact of die-to-die and within-die parameter variations on microprocessor frequency and leakage","volume":"37","author":"tschanz","year":"2002","journal-title":"IEEE JSSC"},{"doi-asserted-by":"publisher","key":"7","DOI":"10.1109\/JSSC.2006.870796"},{"doi-asserted-by":"publisher","key":"6","DOI":"10.1109\/TVLSI.2007.893626"},{"doi-asserted-by":"publisher","key":"5","DOI":"10.1109\/CICC.2005.1568601"},{"doi-asserted-by":"publisher","key":"4","DOI":"10.1109\/ICMTS.2003.1197464"},{"key":"9","first-page":"17","volume":"1","author":"miyazaki","year":"2005","journal-title":"Optimum Threshold-Voltage Tuning for Low-Power High-Performance Microprocessor"},{"doi-asserted-by":"publisher","key":"8","DOI":"10.1109\/JSSC.2003.810054"},{"key":"11","doi-asserted-by":"crossref","DOI":"10.1109\/VLSI.2008.67","article-title":"on-chip process variation detection using slew-rate monitoring circuit in sub-100nm cmos technology","author":"ghosh","year":"2008","journal-title":"IEEE VLSI Design"},{"doi-asserted-by":"publisher","key":"12","DOI":"10.1109\/4.535411"}],"event":{"name":"2008 9th International Symposium of Quality of Electronic Design (ISQED)","start":{"date-parts":[[2008,3,17]]},"location":"San Jose, CA, USA","end":{"date-parts":[[2008,3,19]]}},"container-title":["9th International Symposium on Quality Electronic Design (isqed 2008)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4479672\/4479673\/04479843.pdf?arnumber=4479843","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,24]],"date-time":"2024-02-24T10:48:23Z","timestamp":1708771703000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4479843\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,3]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/isqed.2008.4479843","relation":{},"subject":[],"published":{"date-parts":[[2008,3]]}}}